Inventor
Katsuya Nozawa
Inventor
Osaka, JP
Overview
Patents· 38 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Dprimary
H10DInorganic electric semiconductor devices16%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1012%
C30BSingle-crystal growth8%
G11BInformation storage based on relative movement between record carrier and transducer8%
H01LSemiconductor devices8%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation7%
H04NPictorial communication, e.g. television5%
H10KOrganic electric solid-state devices4%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution4%
G01SRadio direction-finding3%
PatentTitleYear
10,903,264Imaging system and imaging method202110,847,669Photodetection element including photoelectric conversion structure and avalanche structure202010,777,699Photodetection element including photoelectric conversion structure and avalanche structure202010,708,511Three-dimensional motion obtaining apparatus and three-dimensional motion obtaining method202010,672,836Imaging device202010,636,972Method for producing photoelectric conversion element by using photoelectric conversion film including semiconducting carbon nanotubes having different chiralities202010,542,228Imaging system including illuminator and imaging device20209,843,740'Multispectral imaging device and multispectral imaging method'20179,605,998'Measurement system'20178,258,038'Method of manufacturing semiconductor memory'20127,302,456'Stochastic processor and stochastic computer using the same'20077,129,168'Method of estimating substrate temperature'20067,105,449'Method for cleaning substrate and method for producing semiconductor device'20066,930,026'Method of forming a semiconductor wafer having a crystalline layer thereon containing silicon, germanium and carbon'20056,919,253'Method of forming a semiconductor device including simultaneously forming a single crystalline epitaxial layer and a polycrystalline or amorphous layer'20056,858,454'Method for measuring semiconductor constituent element content and method for manufacturing a semiconductor device'20056,852,602'Semiconductor crystal film and method for preparation thereof'20056,762,106'Semiconductor device and method for fabricating the same'20046,720,587'Structure evaluation method, method for manufacturing semiconductor devices, and recording medium'20046,713,790'Semiconductor device and method for fabricating the same'20046,674,100'SiGeC-based CMOSFET with separate heterojunctions'20046,660,393'SiGeC semiconductor crystals and the method producing the same'20036,649,496'Production method for semiconductor crystal'20036,645,836'Method of forming a semiconductor wafer having a crystalline layer thereon containing silicon, germanium and carbon'20036,537,369'SiGeC semiconductor crystal and production method thereof'20036,455,364'Semiconductor device and method for fabricating the same'20026,403,976'Semiconductor crystal, fabrication method thereof, and semiconductor device'20026,399,993'Semiconductor device and method for fabricating the same'20026,399,970'FET having a Si/SiGeC heterojunction channel'20026,277,657'Apparatus for fabricating semiconductor device and fabrication method therefor'20016,190,975'Method of forming HCMOS devices with a silicon-germanium-carbon compound semiconductor layer'20015,209,427'Brake mechanism of magnetic recording and reproducing apparatus'19935,031,056'Tape tension mechanism'19914,939,602'Cassette holder mechanism'19904,899,951'Braking mechanism for use in a magnetic recording apparatus'19904,841,392'Tape loading apparatus having an arrangement for controlling movement of a guide roller holder arm'19894,788,609'Driving power switching mechanism for cassette tape reproducing apparatus'19884,785,362'Driving force branching gear mechanism'1988Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1988–1993Patents assigned to CLARION CO LTD (7)· patent assignee history
1988–1991Based in Tokyo, JP· patent location history
1993Based in Saitama, JP· patent location history
2001–2007Patents assigned to MATSUSHITA ELECTRIC INDUSTRIAL CO LTD (21)· patent assignee history
2001–2021Based in Osaka, JP· patent location history
2012Patents assigned to NOZAWA KATSUYA (1)· patent assignee history
2012Patents assigned to PANASONIC CORP (1)· patent assignee history
2017–2021Patents assigned to PANASONIC IP MAN CO LTD (9)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MATSUSHITA ELECTRIC INDUSTRIAL CO LTD | 21 | 2001–2007 |
| PANASONIC IP MAN CO LTD | 9 | 2017–2021 |
| CLARION CO LTD | 7 | 1988–1993 |
| NOZAWA KATSUYAself | 1 | 2012 |
| PANASONIC CORP | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Osaka, JP | 31 | 2001–2021 |
| Tokyo, JP | 6 | 1988–1991 |
| Saitama, JP | 1 | 1993 |