Inventor
Takahiro Ikeda
Inventor
Oyama, JP
Overview
Patents· 106 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G03Gprimary
G03GElectrography14%
G01NInvestigating or analysing materials by determining their chemical or physical properties11%
G06FElectric digital data processing10%
H04NPictorial communication, e.g. television10%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them8%
G06TImage data processing or generation, in general6%
G06VImage or video recognition or understanding5%
G02BOptical elements, systems or apparatus4%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests3%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h103%
PatentTitleYear
10,840,750Compressor motor and compressor equipped with same202010,649,388Image forming apparatus202010,558,137Image forming apparatus for removing adhered matter from a charging unit202010,509,341Image forming apparatus201910,401,779Image forming apparatus201910,268,135Image forming apparatus for removing adhered matter from a charging unit201910,256,262System and method for Hilbert phase imaging201910,248,043Image forming apparatus that prevents toner charged with polarity opposite normal charging polarity from being collected201910,241,445Image forming apparatus201910,185,239Image forming apparatus201910,168,645Image forming apparatus where primary transfer is performed with electric current flowing in circumferential direction of intermediate transfer belt201910,067,444Remanufacturing method of developer accommodating unit201810,070,544Arrangement for compensating pressure in a housing201810,031,442Remanufacturing method of developer accommodating unit20189,944,489Recording medium processing apparatus20189,921,514'Image forming apparatus for removing adhered matter from a charging unit'20189,910,387'Remanufacturing method of developer accommodating unit'20189,904,988'Image processing method and image processing program'20189,897,942'Image forming apparatus controlling contact pressure between image bearing member and transfer device'20189,759,987'Stroboscopic device'20179,703,232'Image forming apparatus that performs a contacting operation for contacting a developing member with an image bearing member'20179,678,458'Remanufacturing method of developer accommodating unit'20179,562,546'Hydraulic control circuit and its control method'20179,555,424'Airbrush'20179,535,372'Remanufacturing method of developer accommodating unit'20179,465,321'Remanufacturing method of developer accommodating unit'20169,441,733'Continuously variable transmission and a hydraulic control method thereof'20169,423,343'Membrane potential change detection device and membrane potential change detection method'20169,354,587'Image forming apparatus with cleaning unit'20169,325,908'Image-capturing apparatus including shutter unit with pre-driving operation'20169,287,088'Semiconductor circuit'20169,239,548'Image forming apparatus'20169,212,732'Continuously variable transmission and its hydraulic pressure control method'20159,165,557'Voice recognizing apparatus, voice recognizing method, and program for recognizing voice'20158,995,862'Image forming apparatus'20158,983,962'Question and answer data editing device, question and answer data editing method and question answer data editing program'20158,960,006'Ultrasonic inspection apparatus, ultrasonic probe apparatus used for ultrasonic inspection apparatus, and ultrasonic inspection method'20158,941,759'Interchangeable lens and digital camera including controller for stopping zoom lens at one of discrete predetermined stop positions'20158,890,980'Imaging apparatus and zoom lens with adjustable stop positions'20148,891,003'Imaging apparatus including hot shoe'20148,873,027'Cell observation device and cell observation method'20148,867,815'Sample identification device and sample identification method'20148,811,721'Three-dimensional ultrasonic inspection apparatus'20148,804,121'Cell observation device and cell observation method'20148,775,158'Data processing device, data processing method, and data processing program'20148,772,693'System and method for Hilbert phase imaging'20148,698,460'Charger that charges rechargeable battery arranged in electronic device and charging method for rechargeable battery arranged in electronic device'20148,670,148'Image processing apparatus, job management method for the same, and recording medium having recorded thereon job management program'20148,654,245'Imaging device'20148,649,675'Interchangeable lens and camera body'20148,645,961'Image formation apparatus and program'20148,595,247'Text mining device, text mining method, and text mining program'20138,570,539'Image processing device for determining whether or not an application is executable based on whether or not an API is available and a computer-readable medium storing a program'20138,565,632'Image forming apparatus for controlling a temperature of a fixing device therein'20138,488,871'Three-dimensional ultrasonic inspection apparatus'20138,449,148'Lighting device for forming pattern'20138,429,973'Ultrasonic inspection device and ultrasonic inspection method'20138,416,333'Imaging apparatus'20138,400,696'Three-dimensional image display and three-dimensional image displaying method'20138,371,171'Ultrasonic inspection apparatus'20138,229,956'Text mining device, text mining method, and text mining program'20128,213,028'Image processing system, image processing apparatus and program'20128,194,180'Imaging apparatus and camera system'20128,191,422'Copying apparatus'20128,085,338'Imaging apparatus and camera system'20118,020,445'Three-dimensional ultrasonic imaging device'20117,987,723'Copying apparatus'20117,958,693'Boom for excavation machine'20117,930,123'Method, apparatus, and computer readable medium for evaluating a sampling inspection'20117,874,392'Excavating machine'20117,857,083'Excavation machine'2010D0594883'Power shovel'20097,496,456'3D ultrasonographic device'20097,454,066'Extracting method of pattern contour, image processing method, searching method of pattern edge, scanning method of probe, manufacturing method of semiconductor device, pattern inspection apparatus, and program'20087,421,900'Ultrasonograph, ultrasonic transducer, examining instrument, and ultrasonographing device'20087,418,363'Micropattern measuring method, micropattern measuring apparatus, and computer-readable recording medium on which a micropattern measuring program is recorded'20087,412,671'Apparatus and method for verifying an integrated circuit pattern'20087,321,680'Graphic contour extracting method, pattern inspecting method, program and pattern inspecting system'20087,312,908'3D image display and 3D image display method'20077,305,116'Extracting method of pattern contour, image processing method, searching method of pattern edge, scanning method of probe, manufacturing method of semiconductor device, pattern inspection apparatus, and program'20077,248,349'Exposure method for correcting a focal point, and a method for manufacturing a semiconductor device'20077,177,480'Graphic processing method and device'20077,075,098'Method of selecting pattern to be measured, pattern inspection method, manufacturing method of semiconductor device, program, and pattern inspection apparatus'20067,023,587'Image scanning apparatus, recording medium which stores image scanning programs, and data structure'20066,967,719'Method for inspecting exposure apparatus, exposure method for correcting focal point, and method for manufacturing semiconductor device'20056,963,819'Micropattern measuring method, micropattern measuring apparatus, and computer-readable recording medium on which a micropattern measuring program is recorded'20056,839,470'Pattern evaluation method, pattern evaluation system and computer readable recorded medium'20056,815,677'Scanning electron microscope and method of controlling the same'20046,772,089'Graphic contour extracting method, pattern inspecting method, program and pattern inspecting system'20046,642,519'Fine pattern inspection apparatus and method and managing apparatus and method of critical dimension scanning electron microscope device'20036,505,195'Classification of retrievable documents according to types of attribute elements'20036,327,600'Determining copyright information based on overlapping information between portions of two documents'20016,311,322'Program rewriting apparatus'20016,297,874'Film image reading device and a storage medium which stores a control procedure for the film image reading device'20016,243,723'Document classification apparatus'20016,178,424'Information distributing system and storage medium recorded with a program for distributing information'20016,097,548'Device for detecting zoom lens positions and apparatus employing the device'20006,049,375'Picture image input apparatus'20006,008,910'Film image reading apparatus and method in which multiple images are simultaneously displayed'19995,830,623'Pattern lithography method'19985,815,755'Camera and method for setting a used-state display'19985,742,326'Focus adjustable image reading device for calculating a focus position of a source document'19985,721,970'Distance measuring device for a camera'19984,545,667'Camera with automatic strobe'19854,502,770'Motor drive circuit for still camera'19854,396,870'Electronic flash device'1983Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1983–2016Based in Osaka, JP· patent location history
1998–2016Patents assigned to TOSHIBA KK (25)· patent assignee history
1998–2015Based in Tokyo, JP· patent location history
1998–2017Based in Yokohama, JP· patent location history
2001–2015Patents assigned to NEC CORP (9)· patent assignee history
2003–2018Based in Kanagawa, JP· patent location history
2007–2019Patents assigned to HAMAMATSU PHOTONICS KK (8)· patent assignee history
2011–2016Patents assigned to IKEDA TAKAHIRO (28)· patent assignee history
2013–2020Patents assigned to CANON KK (21)· patent assignee history
2016–2020Based in Oyama, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IKEDA TAKAHIROself | 28 | 2011–2016 |
| TOSHIBA KK | 25 | 1998–2016 |
| CANON KK | 21 | 2013–2020 |
| NEC CORP | 9 | 2001–2015 |
| HAMAMATSU PHOTONICS KK | 8 | 2007–2019 |
Locations
| Location | Patents | Span |
|---|---|---|
| Oyama, JP | 18 | 2016–2020 |
| Kanagawa, JP | 15 | 2003–2018 |
| Tokyo, JP | 14 | 1998–2015 |
| Osaka, JP | 13 | 1983–2016 |
| Yokohama, JP | 8 | 1998–2017 |