Inventor

Hua F. Tan

Inventor
Beijing, CN

Overview

21→
Patents
2013–2019
Patent span
Physics
Primary field (CPC G)

Patents· 21 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G06Fprimary
G06FElectric digital data processing53%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes34%
A61BDiagnosis5%
G16HHealthcare informatics, i.e. information and communication technology [ict] specially adapted for the handling or processing of medical or healthcare data5%
H04LTransmission of digital information, e.g. telegraphic communication3%
PatentTitleYear
10,372,593System and method for resource modeling and simulation in test planning201910,235,269System and method to produce business case metrics based on defect analysis starter (DAS) results201910,185,649System and method for efficient creation and reconciliation of macro and micro level test plans20199,594,671'System and method for resource modeling and simulation in test planning'20179,558,464'System and method to determine defect risks in software solutions'20179,519,571'Method for analyzing transaction traces to enable process testing'20169,292,421'System and method for resource modeling and simulation in test planning'20169,262,736'System and method for efficient creation and reconciliation of macro and micro level test plans'20169,112,775'Method and device for establishing backup path, method and device for selecting backup path'20158,893,086'System and method for resource modeling and simulation in test planning'20148,793,656'Method and apparatus for regression testing selection for a framework-based application'20148,689,188'System and method for analyzing alternatives in test plans'20148,667,458'System and method to produce business case metrics based on code inspection service results'20148,645,921'System and method to determine defect risks in software solutions'20148,635,056'System and method for system integration test (SIT) planning'20148,595,700'Method and apparatus for reusing components of a component-based software system'20138,572,562'Method, apparatus and systems thereof for implementing non-function logic extensibly'20138,566,805'System and method to provide continuous calibration estimation and improvement options across a software integration life cycle'20138,539,438'System and method for efficient creation and reconciliation of macro and micro level test plans'20138,495,583'System and method to determine defect risks in software solutions'20138,352,237'System and method for system integration test (SIT) planning'2013

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2013–2019Patents assigned to IBM (20)· patent assignee history
2013–2019Patents assigned to ZHU JUN (13)· patent assignee history
2013–2019Patents assigned to LI SHAO C (10)· patent assignee history
2013–2019Patents assigned to LI ZHONG J (10)· patent assignee history
2013–2019Patents assigned to LIU HE H (10)· patent assignee history
2013–2019Based in Beijing, CN· patent location history
2014Based in Shanghai, CN· patent location history
2015Based in Shenzhen, CN· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
IBM202013–2019
ZHU JUN132013–2019
LI SHAO C102013–2019
LI ZHONG J102013–2019
LIU HE H102013–2019
Locations
LocationPatentsSpan
Beijing, CN192013–2019
Shenzhen, CN12015
Shanghai, CN12014