Inventor

Tetsuji Yamaguchi

Inventor
Kanagawa, JP

Overview

130→
Patents
1992–2021
Patent span
Electricity
Primary field (CPC H)

Patents· 130 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Fprimary
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation19%
H01LSemiconductor devices15%
H10KOrganic electric solid-state devices12%
H04NPictorial communication, e.g. television9%
H10DInorganic electric semiconductor devices8%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution7%
G01NInvestigating or analysing materials by determining their chemical or physical properties4%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h102%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h102%
Y02PClimate change mitigation technologies in the production or processing of goods2%
PatentTitleYear
10,893,386Mobile terminal position detecting device202110,847,581Solid-state imaging apparatus and electronic apparatus202010,833,110Solid-state image pickup unit and electronic apparatus202010,818,712Solid-state image pickup device and method of manufacture, and electronic device202010,818,713Solid-state imaging device and electronic apparatus including a photoelectric conversion unit disposed between another photoelectric conversion unit and a photoelectric conversion film202010,804,328Solid-state imaging device, method of manufacturing the same, and electronic apparatus202010,782,225Optical measurement cell and particle properties measuring instrument using the same202010,770,500Solid state imaging device for reducing dark current202010,715,768Solid-state imaging device and imaging apparatus202010,714,532Imaging device having first, second and third electrodes with an insulating material and a photoelectric conversion layer and driving method for imaging device having the same, and electronic apparatus202010,690,593Sample analyzer and recording medium recording sample analysis program202010,616,515Solid-state imaging device, method for driving the same, and electronic device202010,566,557Solid-state imaging element, production method thereof, and electronic device202010,522,772Photoelectric conversion element and solid-state imaging apparatus201910,504,965Solid-state imaging device201910,468,451Imaging element, stacked-type imaging element, solid-state imaging device, and driving method for solid-state imaging device201910,469,780Solid-state imaging device and electronic apparatus201910,453,898Solid state image sensor pixel electrode below a photoelectronic conversion film201910,451,627Method for assaying soluble GPC3 protein201910,438,983Solid-state imaging device, production method thereof, and electronic device201910,396,113Solid-state imaging device and electronic apparatus including a photoelectric conversion unit disposed between another photoelectric conversion unit and a photoelectric conversion film201910,374,015Photoelectric conversion element and solid-state imaging device201910,369,825Systems and methods for supply quality measurement201910,294,441Coating composition for lubricating coating film201910,271,023Solid-state imaging device and imaging apparatus201910,192,921Solid state imaging device for reducing dark current, method of manufacturing the same, and imaging apparatus201910,178,332Solid-state imaging device using a phase difference signal, method for driving the same, and electronic device201910,147,766Solid-state imaging device, method of manufacturing the same, and electronic apparatus201810,139,402Separation method, detection method, signal measurement method, method for determining disease, method for evaluating drug efficacy of disease treatment drug, kit, and liquid composition201810,074,697Solid-state image pickup unit and electronic apparatus201810,014,350Solid-state image pickup device and manufacturing method thereof201810,008,524Solid-state image pickup unit and electronic apparatus20189,954,021Solid-state imaging device, method for manufacturing the same, and imaging apparatus20189,954,018Solid-state image pickup unit and electronic apparatus20189,938,483Coating composition for lubrication film20189,887,243'Solid-state imaging device, method of manufacturing the same, and electronic apparatus'20189,882,154'Solid-state imaging element, production method thereof, and electronic device'20189,869,626'Particle size distribution measuring apparatus and particle size distribution measuring method'20189,802,263'Electrical discharge machine and method for manufacturing machined object using the same'20179,786,708'Unit pixel having an insulated contact penetrating a charge accumulation region, solid-state image pickup unit including the same, and method of manufacturing the unit pixel'20179,762,867'Solid-state imaging device and imaging apparatus'20179,735,205'Solid-state image pickup device and manufacturing method thereof'20179,735,192'Solid state imaging device for reducing dark current and imaging apparatus'20179,728,564'Solid-state imaging device, method of manufacturing the same, and imaging apparatus'20179,638,619'Optical analysis cell and particle size distribution measuring apparatus'20179,559,149'Solid-state imaging device and electronic apparatus including a photoelectric conversion unit disposed between another photoelectric conversion unit and a photoelectric conversion film'20179,531,971'Imaging device, driving method and electronic apparatus with electric potential applied outside exposure period'20169,496,306'Solid-state imaging device, method for manufacturing the same, and imaging apparatus'20169,484,369'Solid-state imaging device, method of manufacturing the same, and imaging apparatus'20169,478,585'Solid-state image pickup device and manufacturing method thereof'20169,466,645'Solid-state imaging device and imaging apparatus'20169,450,114'Solid-state imaging device and electronic apparatus having a plurality of photoelectric conversion layer for corresponding wavelength regions'20169,443,912'Solid-state image pickup device and manufacturing method thereof'20169,426,399'Solid-state imaging device, method of manufacturing the same, and electronic apparatus'20169,368,536'Solid state imaging device for reducing dark current, method of manufacturing the same, and imaging apparatus'20169,369,647'Solid-state imaging device and imaging apparatus'20169,362,307'Thin film transistor, electronic device having the same, and method for manufacturing the same'20169,281,486'Semiconductor device, method of manufacturing semiconductor device, solid-state imaging unit, and electronic apparatus'20169,219,100'Semiconductor device and solid-state image pickup unit'20159,142,589'Solid-state imaging device, method of manufacturing the same, and imaging apparatus'20159,123,653'Solid-state imaging device, method of manufacturing the same, and electronic apparatus'20159,064,762'Solid-state imaging device, method for manufacturing solid-state imaging device, and imaging apparatus'20159,034,164'Particle characterization cell and particle characterization instrument'20159,018,688'Solid-state imaging device and imaging apparatus'20159,000,493'Solid-state imaging device, method for producing same, and camera'20158,946,840'Solid state imaging device, with suppressed dark current, method of manufacturing, and imaging apparatus'20158,907,262'Solid state imaging device and electronic apparatus having a photoelectric conversion film outside of a semiconductor substrate and dual charge accumulation unit'20148,872,087'Imaging device, driving method and electronic apparatus with electric potential applied outside exposure period'20148,758,087'Wafer processing method, wafer polishing apparatus, and ingot slicing apparatus'20148,728,852'Solid-state imaging device, production method thereof, and electronic device'20148,704,924'Solid-state imaging device with a photoelectric conversion element, and method thereof'20148,625,093'Particle characterization device'20148,605,183'Solid-state imaging device, method of manufacturing the same, and imaging apparatus'20138,492,804'Solid-state imaging device, method for producing same, and camera'20138,486,748'Method for manufacturing solid-state imaging device'20138,471,347'Solid-state imaging device capable of suppressing generation of dark current and imaging apparatus'20138,471,314'Solid-state imaging device, method for producing same, and camera'20138,450,728'Solid-state imaging device, method of manufacturing the same, and electronic apparatus'20138,431,880'Solid-state imaging device, method of producing the same, and imaging device'20138,410,418'Solid-state imaging device, method for manufacturing the same, and imaging apparatus'20138,397,169'Image forming system capable of causing document box information of the printer driver to automatically adjust to a change in the document box information that is stored in an image forming apparatus'20138,368,784'Solid-state imaging device, method of manufacturing the same, and electronic apparatus'20138,362,693'Display device and manufacturing method of display device'20138,334,552'Solid state imaging device that suppresses generation of dark current, and imaging apparatus'20128,325,366'Image forming system and image forming apparatus'20128,288,836'Solid state imaging device capable of supressing generation of dark current'20128,258,030'Manufacturing method of semiconductor device'20128,183,603'Solid-state imaging device for inhibiting dark current'20128,120,111'Thin film transistor including insulating film and island-shaped semiconductor film'20128,114,719'Memory device and manufacturing method of the same'20128,115,154'Solid-state imaging device, method of producing the same, and imaging device'20128,097,928'Solid-state imaging device, and imaging apparatus'20128,097,569'Coating composition for use in sliding parts'20128,044,574'Display device and manufacturing method of display device'20118,034,649'Solid state imaging device, method of manufacturing the same, and imaging apparatus'20117,923,778'Thin film integrated circuit and method for manufacturing the same, CPU, memory, electronic card and electronic device'20117,868,328'Semiconductor device having antenna over thin film integrated circuit'20117,756,427'Image forming system, image forming apparatus and method for setting printing function with toner container having information providing section that stores information about the quality of toner in the container'20107,745,293'Method for manufacturing a thin film transistor including forming impurity regions by diagonal doping'20107,724,369'Correlator'20107,652,321'Semiconductor device and manufacturing method of the same'20107,608,492'Method for manufacturing semiconductor device and heat treatment method'20097,605,023'Manufacturing method for a semiconductor device and heat treatment method therefor'20097,575,993'Method of manufacturing semiconductor device and display device'20097,524,709'Manufacturing method for a display device'20097,521,368'Method for manufacturing semiconductor device'20097,520,790'Display device and manufacturing method of display device'20097,504,327'Method of manufacturing thin film semiconductor device'20097,504,663'Semiconductor device with a floating gate electrode that includes a plurality of particles'20097,374,981'Thin film transistor, electronic device having the same, and method for manufacturing the same'20087,335,556'Manufacturing method of semiconductor device'20087,323,368'Method for manufacturing semiconductor device and heat treatment method'20087,288,480'Thin film integrated circuit and method for manufacturing the same, CPU, memory, electronic card and electronic device'20077,211,502'Method for manufacturing semiconductor device'20077,192,859'Method of manufacturing semiconductor device and display device'20077,170,176'Semiconductor device'20077,098,087'Manufacturing method of semiconductor device'20067,087,885'Particle size distribution measuring apparatus and method'20067,042,557'Sample supplying device for a dry particle-size distribution measuring apparatus and method'20066,864,979'Particle size distribution measuring apparatus'20056,744,507'Dry particle distribution measuring apparatus and method'20046,568,918'Lubrication coating for the sliding portion of a swashplate compressor'20036,538,051'Aqueous coating agent of hydrophilic resin, MoS2 and Sb2S3 and/or Sb2S5 '20036,473,177'Particle-size distribution measuring apparatus'20026,357,340'Piston compressor piston'20026,334,977'Powder material for powder plasma overlaying and powder plasma overlaying metal'20026,191,853'Apparatus for measuring particle size distribution and method for analyzing particle size distribution'20015,282,355'Exhaust gas NO.sub.x removal system'19945,278,413'Infrared microscopic spectrometer'19945,134,463'Stress relief layer providing high thermal conduction for a semiconductor device'1992

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1994–2020Patents assigned to HORIBA LTD (14)· patent assignee history
1994–2020Based in Kyoto, JP· patent location history
2002–2020Based in Kanagawa, JP· patent location history
2006–2016Patents assigned to SEMICONDUCTOR ENERGY LAB (26)· patent assignee history
2006–2016Based in Atsugi, JP· patent location history
2007–2011Based in Aichi, JP· patent location history
2010–2013Based in Osaka, JP· patent location history
2011–2020Patents assigned to SONY CORP (59)· patent assignee history
2012–2016Patents assigned to YAMAGUCHI TETSUJI (32)· patent assignee history
2016–2020Patents assigned to SONY SEMICONDUCTOR SOLUTIONS CORP (18)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
SONY CORP592011–2020
YAMAGUCHI TETSUJIself322012–2016
SEMICONDUCTOR ENERGY LAB262006–2016
SONY SEMICONDUCTOR SOLUTIONS CORP182016–2020
HORIBA LTD141994–2020
Locations
LocationPatentsSpan
Kanagawa, JP872002–2020
Kyoto, JP131994–2020
Atsugi, JP122006–2016
Osaka, JP32010–2013
Aichi, JP32007–2011