Inventor
Akihiro Namba
Inventor
Tokyo, JP
Overview
Patents· 20 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties14%
G02BOptical elements, systems or apparatus14%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light8%
Y10TTechnical subjects covered by former us classification8%
H02MApparatus for conversion between ac and ac, between ac and dc, or between dc and dc, and for use with mains or similar power supply systems6%
B60LPropulsion of electrically-propelled vehicles4%
G11BInformation storage based on relative movement between record carrier and transducer4%
H01LSemiconductor devices4%
H03HImpedance networks, e.g. resonant circuits4%
H04NPictorial communication, e.g. television4%
PatentTitleYear
11,127,695Power conversion device for reducing an inductance difference between control signal wires of a power semiconductor and suppressing a current unbalancing of the control signals202110,888,740Resin composition for golf balls, and golf ball202110,177,676Power converter20199,847,730Power converter20179,345,160'Electronic device'20168,797,522'Light quantity detection method and device therefor'20148,465,708'Immersion objective lens, retention mechanism for immersion medium, and manufacturing method'20138,465,709'Immersion objective lens, retention mechanism for immersion medium, and manufacturing method thereof'20138,225,486'Method of manufacturing a perpendicular magnetic recording head'20128,179,597'Biological specimen imaging method and biological specimen imaging apparatus'20128,174,686'Focal position determining method, focal position determining apparatus, feeble light detecting apparatus and feeble light detecting method'20127,716,811'Method for manufacturing a thin film magnetic head'20107,294,996'Characteristic evaluating system and characteristic evaluating method'20077,196,339'Light-receiving unit and measuring apparatus including the same'20076,980,294'Biomolecule analyzer'20054,828,388'Method of measuring concentration of substances'19894,826,319'Method and apparatus for measuring immunological reaction with the aid of fluctuation in intensity of scattered light'19894,762,413'Method and apparatus for measuring immunological reaction with the aid of fluctuation in intensity of scattered light'19884,494,549'Device for diagnosing body cavity interiors with supersonic waves'19854,467,361'Image pick-up apparatus'1984Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1984–1989Patents assigned to OLYMPUS OPTICAL CO (5)· patent assignee history
1984–1985Based in Hachioji, JP· patent location history
1988–2021Based in Tokyo, JP· patent location history
2005–2013Patents assigned to OLYMPUS CORP (6)· patent assignee history
2010–2012Based in Kanagawa, JP· patent location history
2012–2014Patents assigned to NAMBA AKIHIRO (6)· patent assignee history
2013Patents assigned to FUKUOKA MORINAO (2)· patent assignee history
2014Based in Hitachi, JP· patent location history
2016–2021Patents assigned to HITACHI AUTOMOTIVE SYSTEMS LTD (4)· patent assignee history
2021Based in Chichibu, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NAMBA AKIHIROself | 6 | 2012–2014 |
| OLYMPUS CORP | 6 | 2005–2013 |
| OLYMPUS OPTICAL CO | 5 | 1984–1989 |
| HITACHI AUTOMOTIVE SYSTEMS LTD | 4 | 2016–2021 |
| FUKUOKA MORINAO | 2 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 13 | 1988–2021 |
| Kanagawa, JP | 2 | 2010–2012 |
| Hachioji, JP | 2 | 1984–1985 |
| Chichibu, JP | 1 | 2021 |
| Hitachi, JP | 1 | 2014 |