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Inventor

Hiroshi Miyai

Inventor
Hitachi, JP

Overview

55→
Patents
1994–2019
Patent span
Physics
Primary field (CPC G)

Patents· 55 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H01Jprimary
H01JElectric discharge tubes or discharge lamps19%
G01NInvestigating or analysing materials by determining their chemical or physical properties17%
G06TImage data processing or generation, in general13%
G09GArrangements or circuits for control of indicating devices using static means to present variable information12%
H04NPictorial communication, e.g. television11%
G01RMeasuring electric variables6%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices5%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%
G02BOptical elements, systems or apparatus4%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein2%
PatentTitleYear
10,192,653Twisted string-shaped electric cable for underwater purpose20199,894,549'Information processing apparatus, radio communication system, and terminal position estimation method'20188,643,707'Image signal processing apparatus, image signal processing method, recording medium, and integrated circuit'20148,599,107'Image system, display device and eyeglasses device used in the same'20138,564,648'Image signal processing apparatus, image signal processing method, recording medium, and integrated circuit'20138,542,246'Color conversion device, color conversion table and color conversion method'20138,421,008'Pattern check device and pattern check method'20138,421,010'Charged particle beam device for scanning a sample using a charged particle beam to inspect the sample'20138,294,752'Image system, image display device and image viewing eyeglasses with them'20128,086,021'Appearance inspection apparatus with scanning electron microscope and image data processing method using scanning electron microscope'20118,086,022'Electron beam inspection system and an image generation method for an electron beam inspection system'20118,036,447'Inspection apparatus for inspecting patterns of a substrate'20117,999,565'Inspection apparatus and inspection method using electron beam'20117,995,833'Method of alignment for efficient defect review'20117,957,579'Pattern inspection method and apparatus'20117,894,658'Pattern inspection method and apparatus'20117,872,219'Illumination device with plural color light sources and first and second integrators'20117,855,363'Inspection method and apparatus using an electron beam'20107,847,805'Display apparatus, display method, program and recording medium'20107,607,784'Light emission method, light emitting apparatus and projection display apparatus'20097,518,383'Inspection apparatus and inspection method using electron beam'20097,457,453'Pattern inspection method and apparatus'20087,425,704'Inspection method and apparatus using an electron beam'20087,294,833'Method of alignment for efficient defect review'20077,269,280'Method and its apparatus for inspecting a pattern'20077,266,235'Pattern inspection method and apparatus'20077,133,550'Pattern inspection method and apparatus'20067,116,816'Method of inspecting a pattern and an apparatus thereof and a method of processing a specimen'20067,116,817'Method and apparatus for inspecting a semiconductor device'20067,071,468'Circuit pattern inspection method and its apparatus'20067,049,587'Apparatus for inspecting a specimen'20067,034,298'Inspection method and apparatus using an electron beam'20066,975,754'Circuit pattern inspection method and apparatus'20056,952,492'Method and apparatus for inspecting a semiconductor device'20056,943,752'Presentation system, a display device, and a program'20056,898,305'Circuit pattern inspection method and apparatus'20056,865,288'Pattern inspection method and apparatus'20056,771,419'Rear projection type image display unit'20046,703,850'Method of inspecting circuit pattern and inspecting instrument'20046,628,248'Image display apparatus and method for compensating display image of image display apparatus'20036,613,593'Method of fabricating a semiconductor device'20036,583,634'Method of inspecting circuit pattern and inspecting instrument'20036,570,611'Image display'20036,511,184'Color image display apparatus'20036,465,781'Method and apparatus for inspecting or measuring a sample based on charged-particle beam imaging, and a charged-particle beam apparatus'20026,333,962'Non-destructive inspection apparatus and inspection system using it'20016,288,756'Luminance correction circuit and video display monitor thereof'20016,049,586'Non-destructive inspection apparatus and inspection system using it'20005,990,853'Projection type image displaying apparatus'19995,933,473'Non-destructive inspection apparatus and inspection system using it'19995,847,778'Video display device'19985,838,396'Projection type image display apparatus with circuit for correcting luminance nonuniformity'19985,640,462'Imaging method of X-ray computerized tomography and apparatus for X-ray computerized tomography'19975,552,906'Optically addressed picture display apparatus'19965,349,460'Remote control system for controlling a television receiver'1994

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1994–2005Patents assigned to MATSUSHITA ELECTRIC INDUSTRIAL CO LTD (11)· patent assignee history
1994–2005Based in Takarazuka, JP· patent location history
1997–2011Patents assigned to HITACHI LTD (21)· patent assignee history
1997–2013Based in Hitachi, JP· patent location history
2003–2014Based in Hyogo, JP· patent location history
2005Based in Yokohama, JP· patent location history
2006–2013Patents assigned to HITACHI HIGH TECH CORP (13)· patent assignee history
2009–2014Patents assigned to PANASONIC CORP (8)· patent assignee history
2011–2014Patents assigned to MIYAI HIROSHI (9)· patent assignee history
2019Based in Osaka, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI LTD211997–2011
HITACHI HIGH TECH CORP132006–2013
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD111994–2005
MIYAI HIROSHIself92011–2014
PANASONIC CORP82009–2014
Locations
LocationPatentsSpan
Hitachi, JP321997–2013
Hyogo, JP122003–2014
Takarazuka, JP71994–2005
Yokohama, JP22005
Osaka, JP12019