LexDanaLexDanabeta
Inventor

Kuo-Hao Chang

Inventor
Hsinchu, TW

Overview

2→
Patents
2005–2015
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices20%
G06FElectric digital data processing20%
G06KGraphical data reading20%
G06TImage data processing or generation, in general20%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1020%
PatentTitleYear
9,082,009'Method of defect image classification through integrating image analysis and data mining'20156,975,974'Overlay error model, sampling strategy and associated equipment for implementation'2005

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2005Patents assigned to MACRONIX INT CO LTD (1)· patent assignee history
2005Based in Taichung, TW· patent location history
2015Patents assigned to NAT UNIV TSING HUA (1)· patent assignee history
2015Based in Hsinchu, TW· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
MACRONIX INT CO LTD12005
NAT UNIV TSING HUA12015
Locations
LocationPatentsSpan
Hsinchu, TW12015
Taichung, TW12005