Inventor

Kenji Inage

Inventor

Tokyo, JP

Overview

1999–2011

Patent span

Physics

Primary field (CPC G)

Patents· 15 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G11Bprimary

G11BInformation storage based on relative movement between record carrier and transducer39%

B82YSpecific uses or applications of nanostructures25%

G01RMeasuring electric variables14%

H01FMagnets8%

G11CStatic stores6%

H10NElectric solid-state devices not otherwise provided for6%

Y10TTechnical subjects covered by former us classification3%

PatentTitleYear

7,916,434'Tunnel magnetoresistive effect element with limited electric popping output voltage'2011 7,417,442'Method and apparatus for testing tunnel magnetoresistive effect element, manufacturing method of tunnel magnetoresistive effect element and tunnel magnetoresistive effect element'2008 7,372,282'Method and apparatus for testing tunnel magnetoresistive effect element, manufacturing method of tunnel magnetoresistive effect element and tunnel magnetoresistive effect element'2008 7,333,303'Magnetoresistive device supplying sense current thereto dependent upon a relationship existent between the thickness of the fixed layer and its magnetization'2008 7,283,328'Thin-film magnetic head, head gimbal assembly with thin-film magnetic head, magnetic disk drive apparatus with head gimbal assembly, method for designing thin-film magnetic head and manufacturing method of thin-film magnetic head'2007 7,236,392'Method and apparatus for testing tunnel magnetoresistive effect element'2007 7,227,772'Method and apparatus for testing tunnel magnetoresistive effect element'2007 7,102,859'Thin-film magnetic head with tunnel magnetoresistive effect element electrically connected in parallel with a resistor element'2006 7,027,271'Magnetoresistive device in a thin-film magnetic head and method of manufacturing same having particular electrode overlay configuration'2006 6,972,933'Head suspension assembly'2005 6,433,540'Method and apparatus for testing composite type magnetic head having a magnetoresistive element and an inductive element'2002 6,340,885'Method and apparatus for testing composite type magnetic head'2002 6,194,896'Method of controlling magnetic characteristics of magnetoresistive effect element and of magnetic head with the element, magnetic head device with magnetoresistive effect element, and magnetic disk unit with the device'2001 6,163,437'Magnetic head with spin valve effect magnetoresistive element and its manufacturing method'2000 5,998,993'Method and apparatus for testing magnetic head with spin-valve magnetoresistive element'1999

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1999–2011Patents assigned to TDK CORP (15)· patent assignee history

1999–2002Based in Nagano, JP· patent location history

2001–2011Based in Tokyo, JP· patent location history

2008Patents assigned to SAE MAGNETICS HK LTD (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
TDK CORP	15	1999–2011
SAE MAGNETICS HK LTD	1	2008

Locations

Location	Patents	Span
Tokyo, JP	12	2001–2011
Nagano, JP	3	1999–2002