LexDanaLexDanabeta
Inventor

Yoichi Ose

Inventor
Mito, JP

Overview

67→
Patents
1992–2021
Patent span
Electricity
Primary field (CPC H)

Patents· 67 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H01Jprimary
H01JElectric discharge tubes or discharge lamps72%
G01NInvestigating or analysing materials by determining their chemical or physical properties13%
G01RMeasuring electric variables5%
B82YSpecific uses or applications of nanostructures4%
B23KSoldering or unsoldering1%
G01BMeasuring length, thickness or similar linear dimensions1%
G01QScanning-probe techniques or apparatus1%
G02BOptical elements, systems or apparatus1%
Y10TTechnical subjects covered by former us classification1%
PatentTitleYear
11,087,947Electron microscope202110,707,046Electron source and electron beam device using the same202010,586,674Field emission electron source, method for manufacturing same, and electron beam device20209,653,256'Charged particle-beam device'20179,640,360'Ion source and ion beam device using same'20179,530,614'Charged particle beam device and arithmetic device'20169,355,815'Electron microscope and electron beam detector'20169,293,293'Electron gun and charged particle beam device having an aperture with flare-suppressing coating'20169,202,668'Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimen'20159,123,501'Device for correcting diffraction aberration of electron beam'20159,111,716'Charged particle microscope'20159,058,959'Scanning ion microscope and secondary particle control method'20158,847,173'Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing same'20148,835,844'Sample electrification measurement method and charged particle beam apparatus'20148,698,080'Scanning electron microscope'20148,455,841'Ion microscope'20138,067,733'Scanning electron microscope having a monochromator'20117,838,827'Monochromator and scanning electron microscope using the same'20107,825,377'Electron beam apparatus with aberration corrector'20107,700,918'Sample electrification measurement method and charged particle beam apparatus'20107,612,336'Scanning electron microscope having a monochromator'20097,566,892'Electron beam apparatus and method for production of its specimen chamber'20097,459,681'Scanning electron microscope'20087,435,958'Electron beam apparatus and method for production of its specimen chamber'20087,411,192'Focused ion beam apparatus and focused ion beam irradiation method'20087,408,172'Charged particle beam apparatus and charged particle beam irradiation method'20087,399,966'Scanning electron microscope'20087,375,323'Electron beam apparatus with aberration corrector'20087,372,028'Sample electrification measurement method and charged particle beam apparatus'20087,315,024'Monochromator and scanning electron microscope using the same'20087,294,835'Scanning electron microscope'20077,282,722'Charged particle beam apparatus and charged particle beam irradiation method'20077,205,550'Electron beam apparatus and method for production of its specimen chamber'20077,199,365'Electron beam apparatus with aberration corrector'20077,087,899'Sample electrification measurement method and charged particle beam apparatus'20067,075,078'Scanning electron microscope'20067,049,591'Scanning electron microscope'20067,030,376'Electron beam apparatus and method for production of its specimen chamber'20067,022,983'Monochromator and scanning electron microscope using the same'20066,982,427'Electron beam apparatus with aberration corrector'20066,979,821'Scanning electron microscope'20056,956,211'Charged particle beam apparatus and charged particle beam irradiation method'20056,946,656'Sample electrification measurement method and charged particle beam apparatus'20056,885,001'Scanning electron microscope'20056,872,944'Scanning electron microscope'20056,847,038'Scanning electron microscope'20056,787,772'Scanning electron microscope'20046,667,476'Scanning electron microscope'20036,646,262'Scanning electron microscope'20036,555,819'Scanning electron microscope'20036,501,077'Scanning electron microscope'20026,140,641'Ion-trap mass analyzing apparatus and ion trap mass analyzing method'20006,121,610'Ion trap mass spectrometer'20006,043,491'Scanning electron microscope'20005,894,124'Scanning electron microscope and its analogous device'19995,756,993'Mass spectrometer'19985,677,530'Scanning electron microscope'19975,668,368'Apparatus for suppressing electrification of sample in charged beam irradiation apparatus'19975,668,372'Scanning electron microscope and its analogous device'19975,633,496'Mass spectrometry apparatus'19975,623,144'Mass spectrometer ring-shaped electrode having high ion selection efficiency and mass spectrometry method thereby'19975,608,218'Scanning electron microscope'19975,576,538'Apparatus and method for ion beam neutralization'19965,532,483'Mass spectrometer and ion source'19965,466,929'Apparatus and method for suppressing electrification of sample in charged beam irradiation apparatus'19955,095,208'Charged particle generating device and focusing lens therefor'19925,089,699'Secondary charged particle analyzing apparatus and secondary charged particle extracting section'1992

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1992–2014Patents assigned to HITACHI LTD (34)· patent assignee history
1992Based in Hitachi, JP· patent location history
1995–2014Based in Mito, JP· patent location history
2005–2020Patents assigned to HITACHI HIGH TECH CORP (32)· patent assignee history
2011–2016Patents assigned to OSE YOICHI (7)· patent assignee history
2011–2014Patents assigned to EZUMI MAKOTO (3)· patent assignee history
2013–2014Patents assigned to ARAI NORIAKI (3)· patent assignee history
2015–2021Based in Tokyo, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI LTD341992–2014
HITACHI HIGH TECH CORP322005–2020
OSE YOICHIself72011–2016
ARAI NORIAKI32013–2014
EZUMI MAKOTO32011–2014
Locations
LocationPatentsSpan
Mito, JP531995–2014
Tokyo, JP122015–2021
Hitachi, JP21992