Inventor
LEIJIE WANG
Inventor
CN
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions22%
G02BOptical elements, systems or apparatus22%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices17%
A61BDiagnosis9%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein9%
A61MDevices for introducing media into, or onto, the body4%
G01DMeasuring not specially adapted for a specific variable4%
G01MTesting static or dynamic balance of machines or structures4%
H01FMagnets4%
H01QAntennas, i.e. radio aerials4%
PatentTitleYear
12,569,225Method and device for detecting tissue fibrosis202612,393,127Exposure light beam phase measurement method in laser interference photolithography, and photolithography system202512,346,030Device and method for regulating and controlling incident angle of light beam in laser interference lithography202512,332,053Heterodyne grating interferometry system based on secondary diffraction202512,189,300Scanning interference lithographic system202512,064,600Acoustic method for precisely controlling and metering the manual injection dosage202412,038,690Laser interference photolithography system202411,990,273Manufacturing method of thin-film power inductor and thin-film power inductor202411,940,349Plane grating calibration system202411,703,361Five-degree-of-freedom heterodyne grating interferometry system202311,612,375Method and device for detecting inflammation activity of tissue202311,525,673Five-degree-of-freedom heterodyne grating interferometry system202211,307,018Two-degree-of-freedom heterodyne grating interferometry measurement system202211,228,113Wide-beam planar backfire and bidirectional circularly-polarized antenna2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2025Patents assigned to UNIV TSINGHUA (9)· patent assignee history
2022–2025Patents assigned to BEIJING U PREC TECH CO LTD (8)· patent assignee history
2022–2026Based in CN· patent location history
2023–2026Patents assigned to WUXI HISKY MEDICAL TECH CO LTD (2)· patent assignee history
2023Patents assigned to LU FENGMIN (1)· patent assignee history
2024Patents assigned to HENGDIAN GROUP DMEGC MAGNETICS CO LTD (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| UNIV TSINGHUA | 9 | 2022–2025 |
| BEIJING U PREC TECH CO LTD | 8 | 2022–2025 |
| WUXI HISKY MEDICAL TECH CO LTD | 2 | 2023–2026 |
| HENGDIAN GROUP DMEGC MAGNETICS CO LTD | 1 | 2024 |
| LU FENGMIN | 1 | 2023 |
Locations
| Location | Patents | Span |
|---|---|---|
| CN | 14 | 2022–2026 |