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Inventor

Noriyuki Miyahara

Inventor
Hachiouji, JP

Overview

5→
Patents
1988–1989
Patent span
Physics
Primary field (CPC G)

Patents· 5 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G02Bprimary
G02BOptical elements, systems or apparatus67%
G01BMeasuring length, thickness or similar linear dimensions17%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests17%
PatentTitleYear
4,832,474'Microscope apparatus for examining wafer'19894,769,530'Focusing degree-detecting device with a reduction optical system'19884,744,642'Microscope'19884,734,570'Active focus detecting device with infrared source'19884,732,485'Optical surface profile measuring device'1988

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1988–1989Patents assigned to OLYMPUS OPTICAL CO (5)· patent assignee history
1988–1989Based in Hachiouji, JP· patent location history
1988Based in Tokyo, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
OLYMPUS OPTICAL CO51988–1989
Locations
LocationPatentsSpan
Hachiouji, JP41988–1989
Tokyo, JP11988