Inventor
Yutaka Shida
Inventor
Tokyo, JP
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties44%
B03BSeparating solid materials using liquids or using pneumatic tables or jigs11%
B07BSeparating solids from solids by sieving, screening, sifting or by using gas currents11%
B09BDisposal of solid waste not otherwise provided for11%
B09CReclamation of contaminated soil11%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
PatentTitleYear
7,394,532'Surface inspection method and apparatus'20086,611,328'Surface inspecting apparatus and method'20036,587,192'Surface inspecting apparatus and method'20036,402,064'Method and system for carrying out treatment of granular substances with pollutants adhered'20026,204,918'Apparatus for surface inspection'2001Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2001–2008Patents assigned to TOPCON CORP (4)· patent assignee history
2001–2008Based in Tokyo, JP· patent location history
2002Patents assigned to KAMAGAIGUMI KK (1)· patent assignee history
2002Patents assigned to SHINROKU SEIKI KABUSHIKI KAISH (1)· patent assignee history
2002Patents assigned to YOUYU SHIGEN KABUSHIKI KAISHA (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TOPCON CORP | 4 | 2001–2008 |
| KAMAGAIGUMI KK | 1 | 2002 |
| SHINROKU SEIKI KABUSHIKI KAISH | 1 | 2002 |
| YOUYU SHIGEN KABUSHIKI KAISHA | 1 | 2002 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 5 | 2001–2008 |