Inventor
Michael Goelles
Inventor
Jena, DE
Overview
Patents· 12 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus71%
G01NInvestigating or analysing materials by determining their chemical or physical properties12%
G01BMeasuring length, thickness or similar linear dimensions6%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light6%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation6%
PatentTitleYear
10,078,206High-resolution microscope and image splitter arrangment20189,372,333'High resolution microscope and image divider assembly'20169,239,454'Microscope having light sheet illumination of a sample region'20168,908,271'Laser scanning microscope and its operating method'20148,848,268'Microscope with light sheet illumination'20148,497,464'Detector arrangement having increased sensitivity'20137,888,628'Optical zoom system for a light scanning microscope'20117,656,583'Beam combiner employing a wedge-shaped cross-section'20107,488,931'Optical zoom system for a light scanning electron microscope'20097,369,305'Optical zoom system for a light scanning electron microscope'20087,324,271'Laser-scanning microscope with collimator and/or pinhole optics'20087,270,431'Illumination device and its use'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007–2009Patents assigned to ZEISS CARL JENA GMBH (4)· patent assignee history
2007–2018Based in Jena, DE· patent location history
2010–2014Patents assigned to ZEISS CARL MICROIMAGING GMBH (3)· patent assignee history
2013–2018Patents assigned to ZEISS CARL MICROSCOPY GMBH (6)· patent assignee history
2013–2016Patents assigned to GOELLES MICHAEL (4)· patent assignee history
2013–2016Patents assigned to BATHE WOLFGANG (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ZEISS CARL MICROSCOPY GMBH | 6 | 2013–2018 |
| GOELLES MICHAELself | 4 | 2013–2016 |
| ZEISS CARL JENA GMBH | 4 | 2007–2009 |
| ZEISS CARL MICROIMAGING GMBH | 3 | 2010–2014 |
| BATHE WOLFGANG | 2 | 2013–2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Jena, DE | 12 | 2007–2018 |