Inventor
YIBANG WANG
Inventor
CN
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables83%
G01NInvestigating or analysing materials by determining their chemical or physical properties17%
PatentTitleYear
11,971,451Method for determining parameters in on-wafer calibration piece model202411,733,298Two-port on-wafer calibration piece circuit model and method for determining parameters202311,385,175Calibration method and terminal equipment of terahertz frequency band on-wafer S parameter202211,340,286On-wafer S-parameter calibration method202211,275,103Calibration method, system and device of on-wafer s parameter of vector network analyzer2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2024Patents assigned to THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION (5)· patent assignee history
2022Patents assigned to THE 13TH RES INSTITUTE OF CHINA ELECTRONICS (1)· patent assignee history
2022–2024Based in CN· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION | 5 | 2022–2024 |
| THE 13TH RES INSTITUTE OF CHINA ELECTRONICS | 1 | 2022 |
Locations
| Location | Patents | Span |
|---|---|---|
| CN | 5 | 2022–2024 |