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Inventor

Joseph J. Kopanski

Inventor
Bethesda, MD, US

Overview

2→
Patents
1997–2018
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables20%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices20%
G06KGraphical data reading20%
H01CResistors20%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1020%
PatentTitleYear
10,152,666Authentication article and process for making same20185,617,340'Method and reference standards for measuring overlay in multilayer structures, and for calibrating imaging equipment as used in semiconductor manufacturing'1997

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1997–2018Patents assigned to US COMMERCE (2)· patent assignee history
1997Based in Takoma Park, MD, US· patent location history
2018Patents assigned to AHN JUNG JOON (1)· patent assignee history
2018Patents assigned to NATIONAL INSTITUTE OF STANDARDS AND TECH (1)· patent assignee history
2018Based in Bethesda, MD, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
US COMMERCE21997–2018
AHN JUNG JOON12018
NATIONAL INSTITUTE OF STANDARDS AND TECH12018
Locations
LocationPatentsSpan
Bethesda, Maryland, US12018
Takoma Park, Maryland, US11997