Inventor
Yasujiro Yamada
Inventor
Takatsuki, JP
Overview
Patents· 8 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties89%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light11%
PatentTitleYear
10,161,889X-ray fluorescence spectrometer201810,082,475X-ray fluorescence spectrometer201810,012,605X-ray fluorescence spectrometer20188,433,035'X-ray fluorescence analyzing method'20137,450,685'X-ray fluorescence spectrometer and program for use therewith'20086,668,038'X-ray fluorescence spectrometer'20036,647,090'X-ray fluorescence spectrometer'20036,292,532'Fluorescent X-ray analyzer useable as wavelength dispersive type and energy dispersive type'2001Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2001–2008Patents assigned to RIGAKU IND CORP (4)· patent assignee history
2001–2018Based in Takatsuki, JP· patent location history
2013–2018Patents assigned to RIGAKU DENKI CO LTD (4)· patent assignee history
2013Patents assigned to KATAOKA YOSHIYUKI (1)· patent assignee history
2013Patents assigned to MORIKAWA ATSUSHI (1)· patent assignee history
2013Patents assigned to WATANABE KENJI (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| RIGAKU DENKI CO LTD | 4 | 2013–2018 |
| RIGAKU IND CORP | 4 | 2001–2008 |
| KATAOKA YOSHIYUKI | 1 | 2013 |
| MORIKAWA ATSUSHI | 1 | 2013 |
| WATANABE KENJI | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Takatsuki, JP | 8 | 2001–2018 |