Inventor
MASAKI HIROSE
Inventor
JP
Overview
Patents· 33 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus19%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light18%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein6%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation6%
B81BMicrostructural devices or systems, e.g. micromechanical devices5%
H01LSemiconductor devices5%
G03GElectrography5%
H04NPictorial communication, e.g. television5%
B81CProcesses or apparatus specially adapted for the manufacture or treatment of microstructural devices or systems4%
G06TImage data processing or generation, in general4%
PatentTitleYear
12,560,479Light detection device202612,551,949Method for pressing tailstock of machining apparatus, machining apparatus, and computer-readable storage medium202612,532,553Light detection device202612,467,787Light detection device202512,392,661Production method for Fabry-Perot interference filter202512,360,356Optical filter device and method for controlling optical filter device202512,253,413Light detection device202512,248,269Image forming apparatus configured to determine whether or not a roller member has been replaced202512,241,782Transportation method202512,169,143Light detection device202412,164,241Image forming apparatus202412,123,799Electrical inspection method202412,099,313Image forming apparatus202412,003,865Signal processing device, signal processing method, camera system, video system, and server202411,947,140Suctioning method202411,865,701Suction method202411,852,986Image forming apparatus202311,835,388Light detection device202311,796,391Light detection device202311,624,902Wafer inspection method and wafer202311,609,420Wafer202311,592,332Transportation method202311,555,741Optical detection device having adhesive member202311,553,138Signal processing device, signal processing method, camera system, video system, and server202311,448,869Wafer202211,448,553Light detection device202211,422,059Optical inspection device and optical inspection method202211,403,741Video signal processing apparatus, video signal processing method, and program202211,294,170Method for removing foreign matter and method for manufacturing optical detection device202211,223,778Signal processing device, signal processing method, camera system, video system, and server202211,190,744Image processing device, image processing method, and program for determining a cost function for mode selection202111,156,500Optical measurement control program, optical measurement system, and optical measurement method202111,137,698Image forming apparatus including notifying information on developing unit lifetime2021Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2021–2026Patents assigned to HAMAMATSU PHOTONICS KK (22)· patent assignee history
2021–2025Patents assigned to CANON KK (5)· patent assignee history
2021–2023Patents assigned to SONY CORP (4)· patent assignee history
2021–2026Based in JP· patent location history
2023–2024Patents assigned to SONY GROUP CORP (2)· patent assignee history
2026Patents assigned to YAMAZAKI MAZAK CORP (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HAMAMATSU PHOTONICS KK | 22 | 2021–2026 |
| CANON KK | 5 | 2021–2025 |
| SONY CORP | 4 | 2021–2023 |
| SONY GROUP CORP | 2 | 2023–2024 |
| YAMAZAKI MAZAK CORP | 1 | 2026 |
Locations
| Location | Patents | Span |
|---|---|---|
| JP | 33 | 2021–2026 |