Inventor
Satoshi Mitsuyama
Inventor
Tokyo, JP
Overview
Patents· 17 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties52%
G06FElectric digital data processing10%
G06VImage or video recognition or understanding10%
G16HHealthcare informatics, i.e. information and communication technology [ict] specially adapted for the handling or processing of medical or healthcare data7%
B01FMixing, e.g. dissolving, emulsifying or dispersing3%
G06TImage data processing or generation, in general3%
G16CComputational chemistry3%
G16ZInformation and communication technology [ict] specially adapted for specific application fields, not otherwise provided for3%
Y02ATechnologies for adaptation to climate change3%
Y10TTechnical subjects covered by former us classification3%
PatentTitleYear
10,352,864Automatic analyzer for identifying a cause of abnormalities of measurement results201910,281,439Method of transmitting control data for system conversion among liquid chromatographs201910,203,277Automatic analysis device and automatic analysis method20199,562,917'Automatic analysis device and automatic analysis program'20179,494,525'Automated analyzer and automated analysis method'20169,488,667'Automatic analyzer'20169,476,893'Automatic analysis device and analysis method'20169,310,388'Automatic analyzer and analysis method'20169,239,281'Method and device for dividing area of image of particle in urine'20169,217,712'Method for assisting judgment of abnormality of reaction process data and automatic analyzer'20159,110,019'Analytical apparatus and analytical method'20158,831,306'Flow type particle image analysis method and device'20147,660,676'Nucleic acid base sequence determining method and inspecting system'20107,054,756'Bacteriological examination system'20066,549,661'Pattern recognition apparatus and pattern recognition method'20035,911,002'Pattern recognition system'19995,768,412'Region segmentation method for particle images and apparatus thereof'1998Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1998–2019Based in Tokyo, JP· patent location history
2014–2019Patents assigned to HITACHI HIGH TECH CORP (12)· patent assignee history
2014–2019Patents assigned to MITSUYAMA SATOSHI (10)· patent assignee history
2014–2019Patents assigned to MANRI CHIHIRO (9)· patent assignee history
2015–2019Patents assigned to MIMURA TOMONORI (7)· patent assignee history
2016–2019Patents assigned to KAMIHARA KUMIKO (6)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 12 | 2014–2019 |
| MITSUYAMA SATOSHIself | 10 | 2014–2019 |
| MANRI CHIHIRO | 9 | 2014–2019 |
| MIMURA TOMONORI | 7 | 2015–2019 |
| KAMIHARA KUMIKO | 6 | 2016–2019 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 17 | 1998–2019 |