Inventor
Seiya Suzuki
Inventor
Atsugi, JP
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables60%
H04LTransmission of digital information, e.g. telegraphic communication40%
PatentTitleYear
10,234,483Sampling circuit, sampling method, sampling oscilloscope, and waveform display method20198,432,958'Apparatus for measuring jitter transfer characteristic'20138,208,586'Jitter measuring apparatus'20126,782,353'Instrument for measuring characteristic of data transmission system with high accuracy and clock reproducing circuit used therefor'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2019Patents assigned to ANRITSU CORP (4)· patent assignee history
2004–2013Based in Atsugi, JP· patent location history
2012–2013Patents assigned to MOCHIZUKI KEN (2)· patent assignee history
2012–2013Patents assigned to SUZUKI SEIYA (2)· patent assignee history
2012Patents assigned to TSUCHIYA NAOSUKE (1)· patent assignee history
2013Patents assigned to AOKI TAKASHI (1)· patent assignee history
2019Based in Kanagawa, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ANRITSU CORP | 4 | 2004–2019 |
| MOCHIZUKI KEN | 2 | 2012–2013 |
| SUZUKI SEIYAself | 2 | 2012–2013 |
| AOKI TAKASHI | 1 | 2013 |
| TSUCHIYA NAOSUKE | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Atsugi, JP | 3 | 2004–2013 |
| Kanagawa, JP | 1 | 2019 |