Inventor

Atsumi Kaneko

Inventor
Tokyo, JP

Overview

31→
Patents
1987–2012
Patent span
Physics
Primary field (CPC G)

Patents· 31 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Cprimary
G01CMeasuring distances, levels or bearings37%
H04NPictorial communication, e.g. television20%
G02BOptical elements, systems or apparatus17%
G01SRadio direction-finding9%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them4%
A61BDiagnosis2%
C04BLime, magnesia2%
G01DMeasuring not specially adapted for a specific variable2%
G06KGraphical data reading2%
G08GTraffic control systems2%
PatentTitleYear
8,120,693'Imaging unit and mobile electronic device'20128,107,004'Imaging device'20128,098,320'Imaging device'20127,656,432'Method and apparatus for photographing moving object'20107,268,801'Digital-camera-provided binoculars'20077,218,384'Surveying system'20077,098,997'Surveying system'20067,075,634'Surveying system'20066,937,391'Optical viewer instrument with photographing function'20056,927,906'Binocular telescope with photographing function'20056,914,636'Optical viewer instrument with photographing function'20056,771,434'Optical device'20046,717,683'Target for photogrammetric analytical measurement system'20046,628,803'Device for calculating positional data of standard points of photogrammetric target'20036,600,511'Camera for use in photogrammetric analytical measurement'20036,487,517'Target for photogrammetric analytical measurement system'20026,339,683'Standard measurement scale and markers for defining standard measurement scale'20026,324,024'Reflector for distance measurement'20016,304,669'Photogrammetric analytical measurement system'20016,144,761'Photogrammetric analytical measurement system'20006,108,497'Standard measurement scale and markers for defining standard measurement scale'20006,059,720'Endoscope system with amplification of fluorescent image'20005,995,765'Camera with distance-measuring sensor unit for use in photogrammetric analytical measurement'19995,991,706'Electronic measuring apparatus'19995,949,548'Height sensing measurement device'19995,737,068'Electronic distance measuring device using a phase difference detection method'19985,486,688'Non-scanning type optical reading apparatus having illuminating equalization filter'19965,216,480'Surveying instrument'19934,702,008'Zero setting device in surveying instrument'19874,682,218'Surveying instrument with image display unit'19874,678,910'Reference position-detecting device for photoelectric encoder'1987

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1987–2002Patents assigned to ASAHI OPTICAL CO LTD (15)· patent assignee history
1987–2012Based in Tokyo, JP· patent location history
2002–2007Patents assigned to PENTAX CORP (12)· patent assignee history
2010–2012Patents assigned to HOYA CORP (4)· patent assignee history
2012Patents assigned to KANEKO ATSUMI (3)· patent assignee history
2012Patents assigned to NOMURA HIROSHI (3)· patent assignee history
2012Based in Saitama, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
ASAHI OPTICAL CO LTD151987–2002
PENTAX CORP122002–2007
HOYA CORP42010–2012
KANEKO ATSUMIself32012
NOMURA HIROSHI32012
Locations
LocationPatentsSpan
Tokyo, JP301987–2012
Saitama, JP12012