LexDanaLexDanabeta
Inventor

James E. Boyette, Jr.

Inventor
Delray Beach, FL, US

Overview

17→
Patents
1995–2021
Patent span
Physics
Primary field (CPC G)

Patents· 17 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables44%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices8%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h108%
A63BApparatus for physical training, gymnastics, swimming, climbing, or fencing4%
B23QDetails, components, or accessories for machine tools, e.g. arrangements for copying or controlling4%
G01QScanning-probe techniques or apparatus4%
G04FTime-interval measuring4%
G06TImage data processing or generation, in general4%
H03KPulse technique4%
H04LTransmission of digital information, e.g. telegraphic communication4%
PatentTitleYear
10,965,442Low-power, low-latency time-to-digital-converter-based serial link202110,911,737Primary and auxiliary image capture devices for image processing and related methods202110,409,154Method and apparatus for pellicle removal20199,958,771Method and apparatus for pellicle removal20187,214,149'Method for playing a table tennis game and playing table'20076,252,414'Method and apparatus for testing circuits having different configurations with a single test fixture'20016,093,930'Automatic probe replacement in a scanning probe microscope'20006,034,524'Apparatus and method for testing flexible circuit substrates'20006,023,171'Dual-contact probe tip for flying probe tester'20005,757,159'Height stage for positioning apparatus'19985,635,849'Miniature probe positioning actuator'19975,598,104'Breakaway test probe actuator used in a probing apparatus'19975,550,483'High speed test probe positioning system'19965,543,726'Open frame gantry probing system'19965,532,611'Miniature probe positioning actuator'19965,467,020'Testing fixture and method for circuit traces on a flexible substrate'19955,461,324'Split-fixture configuration and method for testing circuit traces on a flexible substrate'1995

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1995–2001Patents assigned to IBM (11)· patent assignee history
1995–2001Based in Delray Beach, FL, US· patent location history
2007Patents assigned to BOYETTE JAMES (1)· patent assignee history
2007Based in Chesapeake, VA, US· patent location history
2018–2019Patents assigned to RAVE LLC (2)· patent assignee history
2018–2019Based in Lake Worth, FL, US· patent location history
2019Patents assigned to BRUKER NANO INC (1)· patent assignee history
2021Patents assigned to 3DMEDIA CORP (1)· patent assignee history
2021Based in Holly Springs, NC, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
IBM111995–2001
RAVE LLC22018–2019
3DMEDIA CORP12021
BOYETTE JAMESself12007
BRUKER NANO INC12019
Locations
LocationPatentsSpan
Delray Beach, Florida, US121995–2001
Holly Springs, NC, US22021
Lake Worth, Florida, US22018–2019
Chesapeake, Virginia, US12007