Inventor
Makiko Nagashima
Inventor
Tokyo, JP
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions36%
G01NInvestigating or analysing materials by determining their chemical or physical properties27%
G06TImage data processing or generation, in general18%
G01QScanning-probe techniques or apparatus9%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests9%
PatentTitleYear
9,805,461'Fluoroscopic image density correction method, and image processing device'20179,524,546'Fluoroscopic image density correction method, non-destructive inspection method, and image processing device'20168,737,682'Pipe thickness measuring device and method, and recording medium'20145,736,745'Contamination evaluating apparatus'1998Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1998Patents assigned to MITSUBISHI ELECTRIC CORP (1)· patent assignee history
1998Patents assigned to RYODEN SEMICONDUCTOR SYST ENG (1)· patent assignee history
1998Based in Hyogo, JP· patent location history
2014–2017Patents assigned to FUJIFILM CORP (3)· patent assignee history
2014–2017Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| FUJIFILM CORP | 3 | 2014–2017 |
| MITSUBISHI ELECTRIC CORP | 1 | 1998 |
| RYODEN SEMICONDUCTOR SYST ENG | 1 | 1998 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 3 | 2014–2017 |
| Hyogo, JP | 1 | 1998 |