Inventor

Thomas W. Dey

Inventor

Springwater, NY, US

Overview

25→

Patents

1990–1999

Patent span

Physics

Primary field (CPC G)

Patents· 25 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Mprimary

G01MTesting static or dynamic balance of machines or structures31%

G01BMeasuring length, thickness or similar linear dimensions19%

G02BOptical elements, systems or apparatus19%

Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests9%

G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light6%

A63FCard, board, or roulette games3%

B24CAbrasive or related blasting with particulate material3%

G01CMeasuring distances, levels or bearings3%

G21KHandling of particles or ionising radiation not otherwise provided for3%

H04NPictorial communication, e.g. television3%

PatentTitleYear

5,902,994'Apparatus for calibrating a linear image sensor'1999 5,835,267'Radiometric calibration device and method'1998 5,659,168'Radiometric calibration system'1997 5,573,446'Abrasive air spray shaping of optical surfaces'1996 5,552,594'Focus detecting system using a beam splitter to form an image at nominal best focus, slightly in front of best focus and slightly behind best focus'1996 5,402,238'Assembly suitable for determining a surface topology of a workpiece'1995 5,361,129'Method of assessing a surface figure of an optical element'1994 5,309,375'A method for determining a surface topology of a workpiece'1994 5,283,629'Method for assessing a vertex radius of curvature'1994 5,155,544'Foucault method for testing an optical surface'1992 5,150,256'Optical reticle projector'1992 5,146,072'Method for determining large petal piston in a segmented imaging assembly'1992 5,120,948'Method for simultaneously determining coarse and fine petal piston in a segmented imaging assembly'1992 5,118,935'Composite imaging mask'1992 5,117,305'Modified retroreflector'1992 5,107,370'Astronomical data collection method employing a novel optical reticle projector'1992 5,083,866'Method for monitoring alignment using a modified retroreflector'1992 5,069,528'Remote optical alignment method'1991 5,054,929'Optical alignment method using arbitrary geometric figures'1991 5,022,753'Modified Foucault method for uniquely profiling an imaging device'1991 5,020,905'Application of the Foucault knife-edge test to a segmented optic'1991 5,004,337'Modified Foucault for testing an imaging device in terms of the encircled energy test'1991 4,993,831'Closed loop Foucault knife-edge test'1991 4,979,819'Foucault knife-edge test for quantitatively determining a wavefront aberration over the entire surface of an optical imaging device'1990 4,969,737'Expanded foucault knife-edge test for quantitatively testing an optical imaging device'1990

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1990–1999Patents assigned to EASTMAN KODAK CO (25)· patent assignee history

1990–1999Based in Springwater, NY, US· patent location history

1991Based in Rochester, NY, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
EASTMAN KODAK CO	25	1990–1999

Locations

Location	Patents	Span
Springwater, New York, US	24	1990–1999
Rochester, New York, US	1	1991