Inventor
John T. Yue
Inventor
Los Altos, CA, US
Overview
Patents· 9 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables25%
H10DInorganic electric semiconductor devices19%
B82YSpecific uses or applications of nanostructures13%
G06FElectric digital data processing13%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1013%
G01NInvestigating or analysing materials by determining their chemical or physical properties6%
H04NPictorial communication, e.g. television6%
H10BElectronic memory devices6%
PatentTitleYear
8,000,520'Apparatus and method for testing image sensor wafers to identify pixel defects'20116,180,441'Bar field effect transistor'20015,932,911'Bar field effect transistor'19995,923,063'Double density V nonvolatile memory cell'19995,786,705'Method for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systems'19985,612,627'Method for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systems'19975,606,518'Test method for predicting hot-carrier induced leakage over time in short-channel IGFETS and products designed in accordance with test results'19975,600,578'Test method for predicting hot-carrier induced leakage over time in short-channel IGFETs and products designed in accordance with test results'19975,504,017'Void detection in metallization patterns'1996Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1996–2001Patents assigned to ADVANCED MICRO DEVICES INC (8)· patent assignee history
1996–2011Based in Los Altos, CA, US· patent location history
2011Patents assigned to OMNIVISION TECH INC (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ADVANCED MICRO DEVICES INC | 8 | 1996–2001 |
| OMNIVISION TECH INC | 1 | 2011 |
Locations
| Location | Patents | Span |
|---|---|---|
| Los Altos, California, US | 9 | 1996–2011 |