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Inventor

Masayuki Mizuno

Inventor
Tokyo, JP

Overview

116→
Patents
1981–2016
Patent span
Electricity
Primary field (CPC H)

Patents· 116 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H03Kprimary
H03KPulse technique15%
G01RMeasuring electric variables8%
H04NPictorial communication, e.g. television7%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h107%
G06FElectric digital data processing7%
H03LAutomatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses6%
G11CStatic stores6%
G03GElectrography4%
H04LTransmission of digital information, e.g. telegraphic communication3%
H03HImpedance networks, e.g. resonant circuits2%
PatentTitleYear
9,391,686'Wireless communication system and data transmitter'20169,287,968'Wireless communication system and data transmitter'20169,183,422'Wireless communication system, wireless communication method, radio equipment, and data transmitter'20158,891,413'Radio communication system, radio communication method, and data transmitter'20148,862,934'Redundant computing system and redundant computing method'20148,674,774'Aging diagnostic device, aging diagnostic method'20148,635,040'Signal measuring device and signal measuring method'20148,513,970'Semiconductor device and method of testing the same'20138,444,316'Temperature measuring device and method'20138,446,162'Semiconductor integrated circuit device with test circuit and test method therefor'20138,441,277'Semiconductor testing device, semiconductor device, and testing method'20138,429,663'Allocating task groups to processor cores based on number of task allocated per core, tolerable execution time, distance between cores, core coordinates, performance and disposition pattern'20138,399,960'Semiconductor device'20138,355,884'Signal quality measurement device, spectrum measurement circuit, and program'20138,330,483'Semiconductor device to detect abnormal leakage current caused by a defect'20128,330,254'Semiconductor device'20128,301,936'Apparatus and method for performing a screening test of semiconductor integrated circuits'20128,242,814'Clock generating circuit and clock generating method'20128,243,467'Semiconductor device'20128,178,974'Microstrip structure including a signal line with a plurality of slit holes'20128,140,912'Semiconductor integrated circuits and method of detecting faults of processors'20128,118,591'Heat shield plate for substrate annealing apparatus'20128,115,540'Amplifying apparatus, method of output control and control program'20128,115,507'Circuit and method for parallel testing and semiconductor device'20128,108,719'Information processing device and failure concealing method therefor'20128,093,919'Test circuit, method, and semiconductor device'20128,084,768'Semiconductor device'20118,072,253'Clock adjusting circuit and semiconductor integrated circuit device'20118,023,832'Light receiving circuit and digital system'20118,019,560'Signal measuring device'20118,018,295'Modulation device and pulse wave generation device'20118,004,268'Signal measuring device'20117,911,220'Semiconductor integrated circuit apparatus, measurement result management system, and management server'20117,908,538'Failure prediction circuit and method, and semiconductor integrated circuit'20117,893,742'Clock signal dividing circuit'20117,893,711'Program circuit, semiconductor integrated circuit, voltage application method, current application method, and comparison method'20117,872,524'Amplification circuit, amplification circuit noise reducing method and program thereof'20117,847,595'Input circuit and semiconductor integrated circuit comprising the input circuit'20107,825,408'Semiconductor device'20107,821,249'Phase difference measuring device and phase comparison circuit adjusting method'20107,786,746'Semiconductor integrated circuit apparatus, measurement result management system, and management server'20107,760,819'Digital wireless receiver'20107,721,865'Segment-type friction material'20107,708,044'Molding apparatus for wet friction material'20107,702,945'Semiconductor device and communication control method'20107,619,489'Semiconductor integrated circuit'20097,425,720'Semiconductor device'20087,352,067'Stacked semiconductor device'20087,330,368'Three-dimensional semiconductor device provided with interchip interconnection selection means for electrically isolating interconnections other than selected interchip interconnections'20087,307,439'Semiconductor integrated circuit apparatus, measurement result management system, and management server'20077,302,026'Clock recovery circuit and electronic device using a clock recovery circuit'20077,221,614'Stacked semiconductor memory device'20077,209,376'Stacked semiconductor memory device'20077,165,664'Wet-type segmented friction material and its manufacturing method'20076,853,679'Interconnect circuit for data transmission in an integrated circuit'20056,731,452'Data recording and/or reproducing apparatus and method'20046,633,209'Filter'20036,605,297'Substances having antiobese and visceral fat-reducing functions and utilization thereof'20036,577,208'Radio frequency filter'20036,486,716'Phase compensation circuit'20026,433,408'Highly integrated circuit including transmission lines which have excellent characteristics'20026,414,556'Voltage controlled oscillator having an oscillation frequency variation minimized in comparison with a power supply voltage variation'20026,407,644'Voltage controlled oscillator'20026,404,295'Voltage controlled oscillator with linear input voltage characteristics'20026,378,080'Clock distribution circuit'20026,374,733'Method of manufacturing ceramic substrate'20026,366,616'Motion vector estimating apparatus with high speed and method of estimating motion vector'20026,304,124'Variable delay circuit'20016,249,550'Motion vector estimating apparatus with high speed and method of estimating motion vector'20016,243,033'Signal value representing method and system'20016,229,360'High speed synchronization circuit in semiconductor integrated circuit'20016,141,847'Method of manufacturing composite electronic component'20006,115,150'Image data processing apparatus and image data processing process'20006,078,618'Motion vector estimation system'20006,064,498'Image forming apparatus'20006,051,448'Method of manufacturing an electronic component'20005,978,930'Clock signal control system for stopping and activating a clock signal'19995,905,926'Positioning structure for brake force supplier for use in image forming apparatus'19995,889,928'Output gradation adjustment method in image output apparatus'19995,860,044'Open/close mechanism of upper frame for use in image forming apparatus'19995,852,677'Image data processing apparatus'19985,801,570'Semiconductor intergrated circuit with MOS transistors compensated of characteristic and performance deviations and deviation compensation system therein'19985,790,261'Color correction device to correct errors in input and output portions of an image developing device and method thereof'19985,789,942'High speed signal level converting circuit having a reduced consumed electric power'19985,754,312'Method of and apparatus for detecting pixels constituting dotted image area utilizing distance between change points of pixel values'19985,742,195'Semiconductor integrated circuit with MOS Transistors compensated of characteristic and performance deviations and deviation compensation system therein'19985,729,627'Apparatus for and method of judging dotted image area'19985,726,562'Semiconductor device and power supply controller for same'19985,708,396'Voltage controlled oscillator of a ring oscillator type that includes an odd number of delay units'19985,686,853'Driver circuitry adjusted to allow high speed driving and reduce potential variations of interconnections'19975,670,903'Clock signal distribution circuit having a small clock skew'19975,661,572'Automatic sheet conveying mechanism'19975,629,651'Phase lock loop having a reduced synchronization transfer period'19975,592,127'Voltage-controlled oscillator with reduced phase difference'19975,585,754'Integrated digital circuit'19965,563,554'Voltage controlled oscillator and phase-locked loop circuit'19965,559,461'Drive circuit detecting slow signal transition'19965,524,028'Distributed processing device for a digital filter'19965,445,017'Motor start examining device and method'19955,442,466'Plate sheet conveying mechanism having integrally formed sheet guide'1995D0359754'Developing unit for forming an image'1995D0358164'Photoconductor unit for forming an image'19955,410,362'Two-dimensional digital i.times.j filter of rang, r<i, implemented as degenerated r.times.j digital filter'19955,372,615'Bin cap for mushroom culture'19945,372,616'Bin for mushroom culture'19945,127,644'Paper-supplying device for an image-forming apparatus'1992D0323495'Facsimile transceiver'1992D0323158'Facsimile transceiver'19925,004,217'Paper feeding device'19914,970,561'Multi-color developing device having a retractable mechanism for an image forming apparatus'19904,915,372'Paper feeding device'19904,836,525'Automatic original feeding and discharging unit'19894,813,612'Paper feeding device'19894,623,242'Variable speed image-forming apparatus'19864,557,586'Image-forming apparatus'19854,246,351'Protein adsorbent'1981

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1985–2000Patents assigned to MITA INDUSTRIAL CO LTD (22)· patent assignee history
1985–2003Based in Osaka, JP· patent location history
1995–2005Based in Kobe, JP· patent location history
1996–2014Patents assigned to NEC CORP (70)· patent assignee history
1996–2016Based in Tokyo, JP· patent location history
2007–2010Based in Seto, JP· patent location history
2010–2013Based in Minato-ku, JP· patent location history
2011–2015Patents assigned to MIZUNO MASAYUKI (26)· patent assignee history
2012–2014Patents assigned to NOSE KOICHI (10)· patent assignee history
2012–2016Patents assigned to RENESAS ELECTRONICS CORP (6)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
NEC CORP701996–2014
MIZUNO MASAYUKIself262011–2015
MITA INDUSTRIAL CO LTD221985–2000
NOSE KOICHI102012–2014
RENESAS ELECTRONICS CORP62012–2016
Locations
LocationPatentsSpan
Tokyo, JP701996–2016
Osaka, JP291985–2003
Minato-ku, JP42010–2013
Seto, JP32007–2010
Kobe, JP31995–2005