Inventor
Katsuhiro Shimatake
Inventor
Toyama, JP
Overview
Patents· 1 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Dprimary
G01DMeasuring not specially adapted for a specific variable50%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices50%
Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2021Patents assigned to NIKON CORP (1)· patent assignee history
2021Based in Toyama, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NIKON CORP | 1 | 2021 |
Locations
| Location | Patents | Span |
|---|---|---|
| Toyama, JP | 1 | 2021 |