Inventor
Hideyuki Sawai
Inventor
Chiba, JP
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Kprimary
G01KMeasuring temperature18%
H01LSemiconductor devices18%
H03FAmplifiers18%
G01RMeasuring electric variables9%
G05FSystems for regulating electric or magnetic variables9%
H03KPulse technique9%
H10DInorganic electric semiconductor devices9%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h109%
PatentTitleYear
11,012,041Differential amplifier circuit202110,914,783Test circuit and semiconductor device202110,591,942Voltage regulator and method of controlling voltage regulator202010,348,305Level shift circuit20199,983,067Overheat detection circuit and semiconductor device20189,983,068Overheat detection circuit and semiconductor device2018Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2018–2021Patents assigned to ABLIC INC (6)· patent assignee history
2018Patents assigned to SEIKO INSTR INC (2)· patent assignee history
2018–2021Based in Chiba, JP· patent location history
2019Patents assigned to SII SEMICONDUCTOR CORP (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ABLIC INC | 6 | 2018–2021 |
| SEIKO INSTR INC | 2 | 2018 |
| SII SEMICONDUCTOR CORP | 1 | 2019 |
Locations
| Location | Patents | Span |
|---|---|---|
| Chiba, JP | 6 | 2018–2021 |