Inventor

Hideki Horii

Inventor
Seoul, KR

Overview

59→
Patents
1999–2021
Patent span
Electricity
Primary field (CPC H)

Patents· 59 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Nprimary
H10NElectric solid-state devices not otherwise provided for24%
H10BElectronic memory devices23%
G11CStatic stores11%
H01LSemiconductor devices10%
H10DInorganic electric semiconductor devices7%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h106%
G06FElectric digital data processing4%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h103%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests3%
H04LTransmission of digital information, e.g. telegraphic communication2%
PatentTitleYear
11,005,925Load balancing with power of random choices202110,977,087Steal one-process many work-stealing202110,970,311Scalable snapshot isolation on non-transactional NoSQL202110,934,686Working machine202110,937,284Somatosensory feedback system202110,929,054Scalable garbage collection202110,896,169Distributed system, computer program product and method202110,896,165Management of snapshot in blockchain202110,896,166Management of snapshot in blockchain202110,889,963Working machine202110,714,685Methods of forming semiconductor devices having threshold switching devices202010,636,968Variable resistance memory device and method of manufacturing the same202010,546,894Memory device202010,468,594Variable resistance memory devices201910,403,818Method of forming semiconductor devices having threshold switching devices201910,403,681Memory device including a variable resistance material layer201910,388,867Variable resistance memory devices201910,236,444Variable resistance memory device and method of manufacturing the same201910,224,371Memory device201910,186,552Variable resistance memory device and method of manufacturing the same20199,893,281'Semiconductor device and method of fabricating the same'20189,520,556'Semiconductor device and method of fabricating the same'20169,318,700'Method of manufacturing a phase change memory device'20168,962,438'Variable resistance memory device and method of forming the same'20158,871,559'Methods for fabricating phase change memory devices'20148,735,215'Method of manufacturing variable resistance memory device'20148,581,612'Probe card and test apparatus including the same'20138,580,606'Method of forming resistance variable memory device'20138,552,412'Variable resistance memory device and method of forming the same'20138,299,450'Non-volatile memory device including phase-change material'20128,238,147'Multi-level phase change memory device, program method thereof, and method and system including the same'20128,222,625'Non-volatile memory device including phase-change material'20128,039,298'Phase changeable memory cell array region and method of forming the same'20117,800,095'Phase-change memory device having phase change material pattern shared between adjacent cells and electronic product including the phase-change memory'20107,787,278'Resistance variable memory device and operating method thereof'20107,777,212'Phase change memory devices including carbon-containing adhesive pattern'20107,778,066'Resistance variable memory device and programming method thereof'20107,767,491'Methods of manufacturing semiconductor device'20107,767,568'Phase change memory device and method of fabricating the same'20107,763,878'Phase changeable memory device structures'20107,638,788'Phase change memory device and method of forming the same'20097,638,787'Phase changeable memory cell array region and method of forming the same'20097,605,087'Methods of forming semiconductor devices using di-block polymer layers'20097,575,776'Reflowing of a phase changeable memory element to close voids therein'20097,569,430'Phase changeable structure and method of forming the same'20097,558,100'Phase change memory devices including memory cells having different phase change materials and related methods and systems'20097,498,064'Laser reflowing of phase changeable memory element to close a void therein'20097,495,456'System and method of determining pulse properties of semiconductor device'20097,397,092'Phase changable memory device structures'20087,247,897'Conductive line for a semiconductor device using a carbon nanotube including a memory thin film and semiconductor device manufactured'20077,060,543'Method of forming a conductive line for a semiconductor device using a carbon nanotube and semiconductor device manufactured using the method'20067,037,762'Phase changeable memory devices having multi-level data storage elements and methods of fabricating the same'20067,037,749'Methods for forming phase changeable memory devices'20067,038,261'Integrated circuit memory devices having memory cells therein that utilize phase-change materials to support non-volatile data retention'20066,630,387'Method for forming capacitor of semiconductor memory device using electroplating method'20036,596,149'Manufacturing method for capacitor having electrode formed by electroplating'20036,255,187'Method of fabricating self-aligning stacked capacitor using electroplating method'20016,177,284'Conductive diffusion barrier layer, semiconductor device having the same, and manufacturing thereof'20015,877,062'Methods of forming integrated circuit capacitors having protected diffusion barrier metal layers therein'1999

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1999–2020Patents assigned to SAMSUNG ELECTRONICS CO LTD (49)· patent assignee history
1999–2003Based in Kyungki-do, KR· patent location history
2006–2020Based in Seoul, KR· patent location history
2006Based in Gyeonggi-do, KR· patent location history
2012–2014Patents assigned to HORII HIDEKI (8)· patent assignee history
2012Patents assigned to AHN DONG-HO (2)· patent assignee history
2012Patents assigned to KIM YOUNG-HYUN (2)· patent assignee history
2021Patents assigned to IBM (7)· patent assignee history
2021Based in Tokyo, JP· patent location history
2021Based in Sakai, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
SAMSUNG ELECTRONICS CO LTD491999–2020
HORII HIDEKIself82012–2014
IBM72021
AHN DONG-HO22012
KIM YOUNG-HYUN22012
Locations
LocationPatentsSpan
Seoul, KR412006–2020
Tokyo, JP72021
Kyungki-do, KR41999–2003
Sakai, JP22021
Gyeonggi-do, KR22006