Inventor
Hideo Morishita
Inventor
Tokyo, JP
Overview
Patents· 10 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps91%
G01NInvestigating or analysing materials by determining their chemical or physical properties9%
PatentTitleYear
10,886,101Charged particle beam device202110,262,830Scanning electron microscope and electron trajectory adjustment method therefor201910,241,062Charged particle beam device, sample observation method, sample platform, observation system, and light emitting member201910,014,151Composite charged particle beam device20189,812,288'Sample holder with light emitting and transferring elements for a charged particle beam apparatus'20179,570,268'Electron gun, charged particle gun, and charged particle beam apparatus using electron gun and charged particle gun'20179,536,703'Scanning electron microscope'20179,208,994'Electron beam apparatus for visualizing a displacement of an electric field'20159,029,766'Scanning electron microscope'20158,629,395'Charged particle beam apparatus'2014Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2014–2021Patents assigned to HITACHI HIGH TECH CORP (9)· patent assignee history
2014–2015Patents assigned to HATANO MICHIO (3)· patent assignee history
2014–2015Patents assigned to MORISHITA HIDEO (3)· patent assignee history
2014–2015Patents assigned to OHSHIMA TAKASHI (3)· patent assignee history
2014–2015Patents assigned to ITO SUKEHIRO (2)· patent assignee history
2014–2015Based in Hachioji, JP· patent location history
2015–2021Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 9 | 2014–2021 |
| HATANO MICHIO | 3 | 2014–2015 |
| MORISHITA HIDEOself | 3 | 2014–2015 |
| OHSHIMA TAKASHI | 3 | 2014–2015 |
| ITO SUKEHIRO | 2 | 2014–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 8 | 2015–2021 |
| Hachioji, JP | 2 | 2014–2015 |