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Inventor

Dirk Pfeifer

Inventor
Croton-on-Hudson, NY, US

Overview

2→
Patents
1999–2011
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices25%
G06FElectric digital data processing25%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests25%
Y10TTechnical subjects covered by former us classification25%
PatentTitleYear
8,084,193'Self-segregating multilayer imaging stack with built-in antireflective properties'20115,956,662'Method for load measurement'1999

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1999Based in Buren, DE· patent location history
2011Patents assigned to CHENG JOY (1)· patent assignee history
2011Patents assigned to GOLDFARB DARIO L (1)· patent assignee history
2011Patents assigned to IBM (1)· patent assignee history
2011Patents assigned to MEDEIROS DAVID R (1)· patent assignee history
2011Patents assigned to PFEIFER DIRK (1)· patent assignee history
2011Based in Croton-on-Hudson, NY, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
CHENG JOY12011
GOLDFARB DARIO L12011
IBM12011
MEDEIROS DAVID R12011
PFEIFER DIRKself12011
Locations
LocationPatentsSpan
Croton-on-Hudson, New York, US12011
Buren, DE11999