Inventor
Murlidhar V. Kulkarni
Inventor
Fishkill, NY, US
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties38%
B23KSoldering or unsoldering13%
G01BMeasuring length, thickness or similar linear dimensions13%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light13%
G11BInformation storage based on relative movement between record carrier and transducer13%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1013%
PatentTitleYear
5,544,775'Laser machined slider'19964,844,616'Interferometric dimensional measurement and defect detection method'19894,590,574'Method for determining oxygen and carbon in silicon semiconductor wafer having rough surface'19864,506,158'Dual mode spectrometer test station'19854,432,809'Method for reducing oxygen precipitation in silicon wafers'1984Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1984–1996Patents assigned to IBM (5)· patent assignee history
1984–1986Based in Fishkill, NY, US· patent location history
1989Based in Tucson, AZ, US· patent location history
1996Based in San Jose, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 5 | 1984–1996 |
Locations
| Location | Patents | Span |
|---|---|---|
| Fishkill, New York, US | 3 | 1984–1986 |
| San Jose, California, US | 1 | 1996 |
| Tucson, AZ, US | 1 | 1989 |