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Inventor

Tadahiro Kuroda

Inventor
Yokohama, JP

Overview

65→
Patents
1993–2020
Patent span
Electricity
Primary field (CPC H)

Patents· 65 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Wprimary
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1015%
H03KPulse technique14%
H04BTransmission11%
H10DInorganic electric semiconductor devices8%
G01RMeasuring electric variables7%
G11CStatic stores6%
H01LSemiconductor devices4%
G05FSystems for regulating electric or magnetic variables4%
H02MApparatus for conversion between ac and ac, between ac and dc, or between dc and dc, and for use with mains or similar power supply systems4%
H01FMagnets3%
PatentTitleYear
10,666,324Rotation information transmission apparatus202010,348,365Directional coupling communication apparatus201910,291,290Directional coupling communication apparatus20199,978,717Multilayer semiconductor integrated circuit device20189,979,441Inductive relayed coupling circuit between substrates20189,864,143'Directional coupling-type multi-drop bus'20189,847,305Semiconductor chip with multilayer solenoid coil and multi-chip module comprising the same20179,843,363'Covered wire coupling type information communication network, electromagnetic field coupling communication method and electromagnetic field coupler'20179,749,020'Integrated circuit and layered circuit provided therewith'20179,716,306'Directional coupler and communication device including same'20179,419,684'Inter-module communication apparatus'20169,053,950'Electronic circuit'20158,933,590'Electronic circuit'20158,872,609'Inductor element and integrated circuit device'20148,827,166'Sealed semiconductor recording medium and sealed semiconductor memory'20148,744,349'Multi-stack semiconductor integrated circuit device'20148,704,627'Inductor element, integrated circuit device, and three-dimensional circuit device'20148,704,609'Electronic circuit'20148,648,614'Electronic circuit testing apparatus'20148,611,816'Electronic circuit and communication functionality inspection method'20138,564,093'Semiconductor device and manufacturing method therefor'20138,477,855'Signal transmission system and semiconductor integrated circuit device'20138,467,256'Electronic circuit'20138,423,850'System debugging method, system debugging equipment, processor, wireless-communications interface IC and interface method thereof'20138,283,944'Electronic circuit device'20128,276,822'Electronic circuit'20128,005,119'Integrated circuit'20117,869,548'Ultra-wideband receiver'20117,813,259'Electronic circuit'20107,768,790'Electronic circuit'20107,546,106'Electronic circuit'20096,593,800'Semiconductor integrated circuit device'20036,476,639'Semiconductor integrated circuit device capable of producing output thereof without being influenced by other input'20026,377,063'Semiconductor device and burn-in method thereof'20026,373,291'Pass transistor logic circuit for reducing power consumption'20026,373,323'Semiconductor integrated circuit device with threshold control'20026,331,796'Semiconductor integrated circuit device having transistor logic and load circuits'20016,222,391'Semiconductor integrated circuit'20016,215,159'Semiconductor integrated circuit device'20016,204,707'Flip-flop circuit with clock signal control function and clock control circuit'20016,187,602'CMOS integrated circuit device and its inspecting method and device'20016,166,562'Semiconductor integrated circuit device'20006,124,752'Semiconductor integrated circuit device controlling the threshold value thereof for power reduction at standby mode'20006,081,153'Latch circuit and flip-flop circuit having voltage level converting function'20006,051,442'CMOS integrated circuit device and its inspecting method and device'20006,037,805'Integrated circuit device having small amplitude signal transmission'20006,023,186'CMOS integrated circuit device and inspection method thereof'20006,011,713'Static random access memory including potential control means for writing data in memory cell and write method for memory cell'20006,005,265'Semiconductor integrated circuit device having wiring layout for small amplitude signals'19995,969,536'Semiconductor device and burn-in method thereof'19995,959,472'Driver circuit device'19995,936,436'Substrate potential detecting circuit'19995,933,029'Semiconductor integrated circuit device comprising a bias circuit, a driver circuit, and a receiver circuit'19995,929,693'Substrate bias generator for semiconductor integrated circuit device'19995,834,967'Semiconductor integrated circuit device'19985,764,086'Comparator circuit with wide dynamic range'19985,742,183'Level shift semiconductor device'19985,684,416'Low voltage bipolar transistor logic circuit'19975,627,477'Semiconductor device and burn-in method thereof'19975,614,843'CMOS-PECL level conversion circuit'19975,381,057'ECL gate having active pull-down transistor'19955,369,318'Level translator capable of high speed operation'19945,268,872'Semiconductor integrated circuit capable of compensating errors in manufacturing process'19935,227,865'BiCMOS sense amplifier having input waiting state'19935,187,555'Semiconductor integrated circuit of standard cell system'1993

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1993–2003Patents assigned to TOSHIBA KK (34)· patent assignee history
1993–1995Based in Kawasaki, JP· patent location history
1997–2020Based in Yokohama, JP· patent location history
1997–2002Based in Ichikawa, JP· patent location history
2002–2012Based in Tokyo, JP· patent location history
2009–2020Patents assigned to UNIV KEIO (27)· patent assignee history
2011–2018Based in Kanagawa, JP· patent location history
2012–2018Patents assigned to KURODA TADAHIRO (17)· patent assignee history
2013–2016Patents assigned to ISHIKURO HIROKI (2)· patent assignee history
2017–2018Patents assigned to THRUCHIP JAPAN INC (3)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TOSHIBA KK341993–2003
UNIV KEIO272009–2020
KURODA TADAHIROself172012–2018
THRUCHIP JAPAN INC32017–2018
ISHIKURO HIROKI22013–2016
Locations
LocationPatentsSpan
Yokohama, JP361997–2020
Kanagawa, JP142011–2018
Kawasaki, JP51993–1995
Tokyo, JP42002–2012
Ichikawa, JP31997–2002