Inventor
David Lafaille
Inventor
Meudon, FR
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
A61Bprimary
A61BDiagnosis80%
G01BMeasuring length, thickness or similar linear dimensions20%
PatentTitleYear
7,950,801'Device and method for measuring the contrast of the fringes in a michelson interferometer and system for examination of the eye comprising such a device'20117,658,495'Eye examination device by means of tomography with a sighting device'20107,513,619'High resolution laterial and axial tomography'20097,438,415'Eye examination device by means of tomography with a sighting device'2008Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2008–2011Patents assigned to CENTRE NAT RECH SCIENT (4)· patent assignee history
2008–2011Patents assigned to MAUNA KEA TECHNOLOGIES (4)· patent assignee history
2008–2011Patents assigned to OBSERVATOIRE PARIS (4)· patent assignee history
2008–2011Based in Meudon, FR· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| CENTRE NAT RECH SCIENT | 4 | 2008–2011 |
| MAUNA KEA TECHNOLOGIES | 4 | 2008–2011 |
| OBSERVATOIRE PARIS | 4 | 2008–2011 |
Locations
| Location | Patents | Span |
|---|---|---|
| Meudon, FR | 4 | 2008–2011 |