LexDanaLexDanabeta
Inventor

Michal Yachini

Inventor
Rehovot, IL

Overview

2→
Patents
2019–2020
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1025%
G01BMeasuring length, thickness or similar linear dimensions13%
G01NInvestigating or analysing materials by determining their chemical or physical properties13%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices13%
G06FElectric digital data processing13%
H01LSemiconductor devices13%
H10DInorganic electric semiconductor devices13%
PatentTitleYear
10,876,959Method and system for optical characterization of patterned samples202010,311,198Overlay design optimization2019

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2019–2020Patents assigned to NOVA MEASURING INSTR LTD (2)· patent assignee history
2019–2020Based in Rehovot, IL· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
NOVA MEASURING INSTR LTD22019–2020
Locations
LocationPatentsSpan
Rehovot, IL22019–2020