Inventor
Toshiaki Otaki
Inventor
Yokohama, JP
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties33%
G06TImage data processing or generation, in general20%
G02BOptical elements, systems or apparatus13%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices13%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light7%
H04NPictorial communication, e.g. television7%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h107%
PatentTitleYear
10,719,928Pattern inspection apparatus and pattern inspection method202010,386,308Pattern inspection apparatus for detecting a pattern defect201910,222,341Focusing apparatus, focusing method, and pattern inspection method20199,410,899'Illumination apparatus and pattern inspection apparatus'20169,036,143'Inspection apparatus and inspection method'2015Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2015–2020Patents assigned to NUFLARE TECHNOLOGY INC (5)· patent assignee history
2015–2016Based in Kanagawa, JP· patent location history
2019–2020Based in Yokohama, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NUFLARE TECHNOLOGY INC | 5 | 2015–2020 |
Locations
| Location | Patents | Span |
|---|---|---|
| Yokohama, JP | 3 | 2019–2020 |
| Kanagawa, JP | 2 | 2015–2016 |