Inventor
YOAV BERLATZKY
Inventor
IL
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions29%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light21%
G01NInvestigating or analysing materials by determining their chemical or physical properties14%
H04NPictorial communication, e.g. television14%
G02BOptical elements, systems or apparatus7%
G06TImage data processing or generation, in general7%
G06VImage or video recognition or understanding7%
PatentTitleYear
12,467,879Optical phase measurement method and system202512,456,177System and method for digital optical aberration correction and spectral imaging202512,422,251System and method for optical imaging and measurement of objects202511,385,188System and method for defect detection using multi-spot scanning202211,293,806Wavefront sensor and method of using it2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2025Patents assigned to PXE COMPUTATIONAL IMAGING LTD (3)· patent assignee history
2022Patents assigned to APPLIED MATERIALS ISRAEL LTD (1)· patent assignee history
2022Patents assigned to PXE COMPUTATIONAL IMAGIMG LTD (1)· patent assignee history
2022–2025Based in IL· patent location history
2025Patents assigned to NOVA LTD (1)· patent assignee history
2025Patents assigned to PXE COMPUTATION IMAGING LTD (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| PXE COMPUTATIONAL IMAGING LTD | 3 | 2022–2025 |
| APPLIED MATERIALS ISRAEL LTD | 1 | 2022 |
| NOVA LTD | 1 | 2025 |
| PXE COMPUTATION IMAGING LTD | 1 | 2025 |
| PXE COMPUTATIONAL IMAGIMG LTD | 1 | 2022 |
Locations
| Location | Patents | Span |
|---|---|---|
| IL | 5 | 2022–2025 |