Inventor
David H. Pullen
Inventor
Portland, OR, US
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables21%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1013%
Y10TTechnical subjects covered by former us classification10%
C09KMaterials for miscellaneous applications, not provided for elsewhere8%
F28DHeat-exchange apparatus, not provided for in another subclass, in which the heat-exchange media do not come into direct contact8%
F28FDetails of heat-exchange and heat-transfer apparatus, of general application8%
G06FElectric digital data processing8%
H05KPrinted circuits8%
H10DInorganic electric semiconductor devices8%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution8%
PatentTitleYear
7,886,809'Apparatus and method for passive phase change thermal management'20117,449,904'Integrated circuit burn-in methods and apparatus'20087,320,767'Method of increasing dimensional stability of a mat'20087,316,265'Method for passive phase change thermal management'20086,980,016'Integrated circuit burn-in systems'20056,882,043'Electronic assembly having an indium thermal couple'20056,672,370'Apparatus and method for passive phase change thermal management'20046,461,891'Method of constructing an electronic assembly having an indium thermal couple and an electronic assembly having an indium thermal couple'20026,452,502'Method and apparatus for early detection of reliability degradation of electronic devices'20026,441,675'Method and apparatus for detection of electrical overstress'20026,433,616'Method and apparatus for detection of electrical overstress'20026,366,209'Method and apparatus for early detection of reliability degradation of electronic devices'20026,255,893'Method and apparatus for detection of electrical overstress'20016,094,144'Method and apparatus for early detection of reliability degradation of electronic devices'2000Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2000–2011Patents assigned to INTEL CORP (13)· patent assignee history
2000–2011Based in Portland, OR, US· patent location history
2008Patents assigned to JOHNS MANVILLE (1)· patent assignee history
2008Based in Simpsonville, SC, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| INTEL CORP | 13 | 2000–2011 |
| JOHNS MANVILLE | 1 | 2008 |
Locations
| Location | Patents | Span |
|---|---|---|
| Portland, OR, US | 13 | 2000–2011 |
| Simpsonville, SC, US | 1 | 2008 |