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Inventor

Andrew Humphris

Inventor
Abingdon, GB

Overview

30→
Patents
2005–2021
Patent span
Physics
Primary field (CPC G)

Patents· 30 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Qprimary
G01QScanning-probe techniques or apparatus57%
B82YSpecific uses or applications of nanostructures19%
G01BMeasuring length, thickness or similar linear dimensions9%
G01NInvestigating or analysing materials by determining their chemical or physical properties6%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices4%
G11BInformation storage based on relative movement between record carrier and transducer4%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests2%
PatentTitleYear
10,969,404Scanning probe system202110,928,418Scanning probe microscope202110,585,114Scanning probe system202010,401,381Scanning probe system201910,254,306Probe calibration or measurement routine201910,107,834Measurement system20189,939,460Scanning probe system with multiple probes20189,921,240'Probe actuation system with feedback controller'20189,874,582Probe system with multiple actuation locations20189,784,760'Probe and sample exchange mechanism'20179,739,798'Multiple probe detection and actuation'20179,599,636'Probe microscope with probe movement from heating'20179,557,347'Adaptive mode scanning probe microscope'20179,410,982'Photothermal actuation of a probe for scanning probe microscopy'20169,389,243'Multiple probe actuation'20169,304,144'Multiple probe actuation'20169,291,641'Probe actuation'20169,222,958'Beam scanning system'20159,134,340'Method of investigating a sample surface'20159,052,340'Probe assembly for a scanning probe microscope'20158,910,311'Probe assembly for a scanning probe microscope'20148,732,861'Control system for a scanning probe microscope'20148,528,110'Probe detection system'20138,479,310'Dynamic probe detection system'20138,296,856'Control system for scanning probe microscope'20128,220,066'Vibration compensation in probe microscopy'20127,596,989'Probe for an atomic force microscope'20097,498,564'Resonant scanning near-field optical microscope'20097,473,887'Resonant scanning probe microscope'20096,906,450'Resonant probe driving arrangement and a scanning probe microscope including such an arrangement'2005

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2005Patents assigned to UNIV BRISTOL (1)· patent assignee history
2009–2021Patents assigned to INFINITESIMA LTD (27)· patent assignee history
2009Patents assigned to UNIV BRISTOL OF SENATE HOUSE (2)· patent assignee history
2009Based in Bath, GB· patent location history
2012–2017Patents assigned to HUMPHRIS ANDREW (7)· patent assignee history
2012–2014Patents assigned to CATTO DAVID (2)· patent assignee history
2012–2016Based in Oxfordshire, GB· patent location history
2015–2021Based in Abingdon, GB· patent location history
2015Based in Oxford, GB· patent location history
2017Based in Oxforshire, GB· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
INFINITESIMA LTD272009–2021
HUMPHRIS ANDREWself72012–2017
CATTO DAVID22012–2014
UNIV BRISTOL OF SENATE HOUSE22009
UNIV BRISTOL12005
Locations
LocationPatentsSpan
Abingdon, GB162015–2021
Oxfordshire, GB82012–2016
Bath, GB32009
Oxforshire, GB12017
Oxford, GB12015