Inventor

David J. Michael

Inventor

Wayland, MA, US

Overview

1983–2021

Patent span

Physics

Primary field (CPC G)

Patents· 82 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G06Tprimary

G06TImage data processing or generation, in general29%

G06VImage or video recognition or understanding15%

G06KGraphical data reading7%

H04NPictorial communication, e.g. television7%

C04BLime, magnesia6%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%

G01BMeasuring length, thickness or similar linear dimensions4%

G06FElectric digital data processing4%

G01NInvestigating or analysing materials by determining their chemical or physical properties3%

G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices3%

PatentTitleYear

10,957,072System and method for simultaneous consideration of edges and normals in image features by a vision system2021 10,864,639Simultaneous kinematic and hand-eye calibration2020 10,812,778System and method for calibrating one or more 3D sensors mounted on a moving manipulator2020 10,757,394System and method for calibrating a plurality of 3D sensors with respect to a motion conveyance2020 10,700,940Network planning and optimization2020 10,482,621System and method for improved scoring of 3D poses and spurious point removal in 3D image data2019 10,452,949System and method for scoring clutter for use in 3D point cloud matching in a vision system2019 10,438,036System and method for reading and decoding ID codes on a curved, sloped and/or annular object2019 10,380,767System and method for automatic selection of 3D alignment algorithms in a vision system2019 10,192,283System and method for determining clutter in an acquired image2019 10,057,498Light field vision system camera and methods for using the same2018 9,995,573Probe placement for image processing2018 9,735,036'System and method for aligning a wafer for fabrication'2017 9,679,224'Semi-supervised method for training multiple pattern recognition and registration tool models'2017 9,659,236'Semi-supervised method for training multiple pattern recognition and registration tool models'2017 9,533,418'Methods and apparatus for practical 3D vision system'2017 9,488,469'System and method for high-accuracy measurement of object surface displacement using a laser displacement sensor'2016 9,124,873'System and method for finding correspondence between cameras in a three-dimensional vision system'2015 9,121,751'Weighing platform with computer-vision tracking'2015 8,872,911'Line scan calibration method and apparatus'2014 8,705,851'Method and apparatus for training a probe model based machine vision system'2014 8,588,511'Method and apparatus for automatic measurement of pad geometry and inspection thereof'2013 8,504,402'Schedule optimization using market modeling'2013 8,457,390'Method and apparatus for training a probe model based machine vision system'2013 8,189,904'Image preprocessing for probe mark inspection'2012 8,189,194'Direct illumination machine vision technique for processing semiconductor wafers'2012 8,162,584'Method and apparatus for semiconductor wafer alignment'2012 8,139,231'Machine vision technique for manufacturing semiconductor wafers'2012 8,126,260'System and method for locating a three-dimensional object using machine vision'2012 8,126,253'Automatically determining machine vision tool parameters'2012 8,111,904'Methods and apparatus for practical 3D vision system'2012 8,030,235'Refractory brick for steel ladles'2011 7,965,887'Method of pattern location using color image data'2011 7,885,453'Image preprocessing for probe mark inspection'2011 7,672,862'Generating a supply chain plan'2010 7,639,861'Method and apparatus for backlighting a wafer during alignment'2009 7,242,801'Image preprocessing for probe mark inspection'2007 7,171,036'Method and apparatus for automatic measurement of pad geometry and inspection thereof'2007 6,970,608'Method for obtaining high-resolution performance from a single-chip color image sensor'2005 6,801,649'Method and apparatus for determining a reference point of a bottle bottom in an image'2004 6,539,107'Machine vision method using search models to find features in three-dimensional images'2003 6,421,458'Automated inspection of objects undergoing general affine transformation'2002 6,317,513'Method and apparatus for inspecting solder paste using geometric constraints'2001 6,301,396'Nonfeedback-based machine vision methods for determining a calibration relationship between a camera and a moveable object'2001 6,249,602'Method and apparatus for determining a reference point of an object profile within an image'2001 6,240,218'Apparatus and method for determining the location and orientation of a reference feature in an image'2001 6,173,070'Machine vision method using search models to find features in three dimensional images'2001 6,167,150'Method and apparatus for detecting extended defects in an object'2000 6,141,033'Bandwidth reduction of multichannel images for machine vision'2000 6,137,893'Machine vision calibration targets and methods of determining their location and orientation in an image'2000 6,061,467'Automated optical inspection apparatus using nearest neighbor interpolation'2000 6,035,066'Boundary tracking method and apparatus to find leads'2000 5,987,172'Edge peak contour tracker'1999 5,978,081'Multiple field of view calibration plate for use in semiconductor manufacturing'1999 5,978,521'Machine vision methods using feedback to determine calibration locations of multiple cameras that image a common object'1999 5,978,080'Machine vision methods using feedback to determine an orientation, pixel width and pixel height of a field of view'1999 5,960,125'Nonfeedback-based machine vision method for determining a calibration relationship between a camera and a moveable object'1999 5,943,441'Edge contour tracking from a first edge point'1999 5,912,984'Method and apparatus for in-line solder paste inspection'1999 5,901,241'Labeled projection of digital images'1999 5,872,870'Machine vision methods for identifying extrema of objects in rotated reference frames'1999 5,825,483'Multiple field of view calibration plate having a reqular array of features for use in semiconductor manufacturing'1998 5,825,913'System for finding the orientation of a wafer'1998 5,768,443'Method for coordinating multiple fields of view in multi-camera'1998 5,757,956'Template rotating method for locating bond pads in an image'1998 5,754,679'Image rotating method for locating bond pads in an image'1998 5,751,853'Locating shapes in two-dimensional space curves'1998 5,642,158'Method and apparatus to detect capillary indentations'1997 5,640,199'Automated optical inspection apparatus'1997 5,640,200'Golden template comparison using efficient image registration'1997 5,581,632'Method and apparatus for ball bond inspection system'1996 5,550,763'Using cone shaped search models to locate ball bonds on wire bonded devices'1996 5,548,326'Efficient image registration'1996 5,322,827'Burned refractories with low soluble chromium'1994 4,999,325'Rebonded fused brick'1991 4,957,887'Magnesite-carbon refractories'1990 4,912,068'Magnesite-carbon refractories'1990 4,847,222'Basic refractory shapes'1989 4,574,119'Chrome-magnesite refractories and method of preparation'1986 4,506,022'Slide Gates'1985 4,431,744'Carbon bonded refractory brick'1984 4,391,917'Alumino-silicate refractory brick'1983

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1983–1990Patents assigned to DRESSER IND (7)· patent assignee history

1983–2011Based in White Oak, PA, US· patent location history

1991–2015Patents assigned to MICHAEL DAVID J (11)· patent assignee history

1996–2021Patents assigned to COGNEX CORP (59)· patent assignee history

1996–2001Based in Newton, MA, US· patent location history

1999–2003Based in Framingham, MA, US· patent location history

2005–2012Patents assigned to COGNEX TECH & INVESTMENT CORP (9)· patent assignee history

2005–2021Based in Wayland, MA, US· patent location history

2010–2020Based in Dallas, TX, US· patent location history

2012–2017Patents assigned to LIU GANG (5)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
COGNEX CORP	59	1996–2021
MICHAEL DAVID Jself	11	1991–2015
COGNEX TECH & INVESTMENT CORP	9	2005–2012
DRESSER IND	7	1983–1990
LIU GANG	5	2012–2017

Locations

Location	Patents	Span
Wayland, Massachusetts, US	34	2005–2021
Newton, Massachusetts, US	22	1996–2001
Framingham, Massachusetts, US	11	1999–2003
White Oak, Pennsylvania, US	9	1983–2011
Dallas, Texas, US	3	2010–2020