Inventor
Toru Fujimura
Inventor
Asaka, JP
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties50%
B23QDetails, components, or accessories for machine tools, e.g. arrangements for copying or controlling15%
Y10TTechnical subjects covered by former us classification15%
B24BMachines, devices, or processes for grinding or polishing10%
B01LChemical or physical laboratory apparatus for general use5%
C23CCoating metallic material5%
PatentTitleYear
9,291,548'Cells for biochemical analysis, kit for biochemical analysis, and biochemical analyzer'20168,922,765'Cells for biochemical analysis, kit for biochemical analysis, and biochemical analyzer'20148,525,985'Cells for biochemical analysis, kit for biochemical analysis, and biochemical analyzer'20138,325,335'Cells for biochemical analysis, kit for biochemical analysis, and biochemical analyzer'20128,089,624'Cells for biochemical analysis, kit for biochemical analysis, and biochemical analyzer'20127,834,998'Cells for biochemical analysis, kit for biochemical analysis, and biochemical analyzer'20107,742,165'Cells for biochemical analysis, kit for biochemical analysis, and biochemical analyzer'20107,726,004'Processing cell of automatic machining system and automatic honing system'20107,439,073'Kit for biochemical sensor and measuring apparatus'20087,346,973'Processing cell of automatic machining system and automatic honing system'20087,311,881'Chips, and apparatus and method for reaction analysis'20077,306,941'Biochemical measuring chip and measuring apparatus'20076,920,678'Machining cell in automatic machining system and automatic honing system'20056,821,361'Quantitative measuring method and apparatus of metal phase using x-ray diffraction method, and method for making plated steel sheet using them'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004Based in Chiba, JP· patent location history
2005–2010Patents assigned to NISSIN MFG CO LTD (3)· patent assignee history
2005–2010Based in Kyoto, JP· patent location history
2007–2016Patents assigned to HITACHI LTD (10)· patent assignee history
2007–2012Based in Asaka, JP· patent location history
2012Patents assigned to FUJIMURA TORU (2)· patent assignee history
2012Patents assigned to IDE TATSURO (2)· patent assignee history
2012Patents assigned to KUWABARA KOSUKE (2)· patent assignee history
2013–2016Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI LTD | 10 | 2007–2016 |
| NISSIN MFG CO LTD | 3 | 2005–2010 |
| FUJIMURA TORUself | 2 | 2012 |
| IDE TATSURO | 2 | 2012 |
| KUWABARA KOSUKE | 2 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Asaka, JP | 7 | 2007–2012 |
| Tokyo, JP | 3 | 2013–2016 |
| Kyoto, JP | 3 | 2005–2010 |
| Chiba, JP | 1 | 2004 |