Inventor
Yiren WU
Inventor
US
Overview
Patents· 1 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions50%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1050%
PatentTitleYear
11,913,772Non-destructive gap metrology2024Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2024Patents assigned to INTEL CORP (1)· patent assignee history
2024Based in US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| INTEL CORP | 1 | 2024 |
Locations
| Location | Patents | Span |
|---|---|---|
| US | 1 | 2024 |