Inventor
Francis Howard Little
Inventor
Cincinnati, OH, US
Overview
Patents· 28 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties41%
G01BMeasuring length, thickness or similar linear dimensions18%
G06TImage data processing or generation, in general13%
G21KHandling of particles or ionising radiation not otherwise provided for5%
H01JElectric discharge tubes or discharge lamps5%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests5%
G01TMeasurement of nuclear or x-radiation3%
G06VImage or video recognition or understanding3%
G10KSound-producing devices3%
H05GX-ray technique3%
PatentTitleYear
8,238,642'Methods and apparatus for measuring 3D dimensions on 2D images'20128,205,500'Systems and methods for inspecting an object using ultrasound'20128,179,132'Method and system for integrating eddy current inspection with a coordinate measuring device'20128,010,315'Multi-modality inspection method with data validation and data fusion'20117,921,575'Method and system for integrating ultrasound inspection (UT) with a coordinate measuring machine (CMM)'20117,840,367'Multi-modality inspection system'20107,602,963'Method and apparatus for finding anomalies in finished parts and/or assemblies'20097,346,999'Methods and system for inspection of fabricated components'20087,215,732'Method and system for CT reconstruction with pre-correction'20077,099,017'Methods and apparatus for measuring flow opening areas'20067,065,176'Method and system to inspect a component'20066,985,238'Non-contact measurement system for large airfoils'20066,815,872'Ultrasonic transducer system having an organic-structural-material housing'20046,812,697'Molded eddy current array probe'20046,711,235'X-ray inspection apparatus and method'20046,687,334'X-ray collimator and method of construction'20046,563,307'Eddy current inspection probe'20036,356,069'Eddy current calibration standard'20026,167,110'High voltage x-ray and conventional radiography imaging apparatus and method'20005,903,147'Eddy current array inspection device for shaped holes'19995,848,115'Computed tomography metrology'19985,442,286'Eddy current array inspection device'19955,315,234'Eddy current device for inspecting a component having a flexible support with a plural sensor array'19945,283,822'Blackline indicator for use in tomographic and/or radioscopic inspection of weld joints'19945,119,408'Rotate/rotate method and apparatus for computed tomography x-ray inspection of large objects'19925,013,922'Reduced thickness radiation window for an ionization detector'19914,969,110'Method of using a priori information in computerized tomography'19904,682,964'Ionization detector'1987Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1987–2012Patents assigned to GEN ELECTRIC (27)· patent assignee history
1987–2012Based in Cincinnati, OH, US· patent location history
2012Patents assigned to LITTLE FRANCIS HOWARD (3)· patent assignee history
2012Patents assigned to WU YANYAN (3)· patent assignee history
2012Patents assigned to BATZINGER THOMAS JAMES (2)· patent assignee history
2012Patents assigned to KRAY NICHOLAS JOSEPH (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 27 | 1987–2012 |
| LITTLE FRANCIS HOWARDself | 3 | 2012 |
| WU YANYAN | 3 | 2012 |
| BATZINGER THOMAS JAMES | 2 | 2012 |
| KRAY NICHOLAS JOSEPH | 2 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Cincinnati, OH, US | 28 | 1987–2012 |