Inventor
Satoshi Takenaka
Inventor
Suwa, JP
Overview
Patents· 25 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Fprimary
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein15%
H10DInorganic electric semiconductor devices13%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1012%
G01NInvestigating or analysing materials by determining their chemical or physical properties10%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation8%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light5%
H01LSemiconductor devices5%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light5%
H10HInorganic light-emitting semiconductor devices having potential barriers5%
G04FTime-interval measuring3%
PatentTitleYear
9,634,467'Vertical cavity surface emitting laser and atomic oscillator'20179,513,212'Photoconductive antenna, camera, imaging device, and measurement device'20169,451,184'Photo conductive antenna, camera, imaging apparatus, and measurement apparatus'20169,397,478'Vertical cavity surface emitting laser and atomic oscillator'20169,349,917'Photoconductive antenna, terahertz wave generating device, camera, imaging device, and measuring device'20169,197,034'Vertical cavity surface emitting laser and atomic oscillator'20159,130,118'Photoconductive antenna, terahertz wave generating device, camera, imaging device, and measuring device'20159,097,684'Specimen inspection apparatus'20158,878,134'Photoconductive antenna, terahertz wave generating device, camera, imaging device, and measuring device'20146,910,018'Purchase request approving apparatus, method, and storage medium storing same'20056,882,016'Semiconductor device, electro-optical device, electronic apparatus, and method for manufacturing semiconductor device'20056,822,777'Semi-transparent reflective electro-optic apparatus and electronic equipment using the same'20046,808,965'Methodology for fabricating a thin film transistor, including an LDD region, from amorphous semiconductor film deposited at 530 C. or less using low pressure chemical vapor deposition'20046,767,772'Active matrix substrate, electrooptical device, and method of producing active matrix substrate'20046,765,637'Translucent reflection type electro-optic devices and methods for manufacturing the same'20046,763,335'Purchase request apparatus and system'20046,614,053'Active matrix substrate, electrooptical device, and method of producing active matrix substrate'20036,403,497'Method of manufacturing semiconductor device by two stage heating of deposited noncrystalline semiconductor'20026,235,563'Semiconductor device and method of manufacturing the same'20016,180,957'Thin-film semiconductor device, and display system using the same'20015,953,582'Active matrix panel manufacturing method including TFTS having variable impurity concentration levels'19995,834,827'Thin film semiconductor device, fabrication method thereof, electronic device and its fabrication method'19985,563,427'Active matrix panel and manufacturing method including TFTs having variable impurity concentration levels'19965,070,049'Starting composition for the production of silicon carbide and method of producing the same'19914,246,342'Process for the manufacture of pyruvate oxidase, and analytical method and kit for the use of the same'1981Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1981Patents assigned to TOYO JOZO KK (1)· patent assignee history
1991Patents assigned to IBIDEN CO LTD (1)· patent assignee history
1996–2017Patents assigned to SEIKO EPSON CORP (21)· patent assignee history
1996–2004Based in Suwa, JP· patent location history
1998–2016Based in Nagano, JP· patent location history
2004–2005Patents assigned to CANON KK (2)· patent assignee history
2004–2005Based in Urawa, JP· patent location history
2005Based in Ryuo-cho, JP· patent location history
2015–2017Based in Chino, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SEIKO EPSON CORP | 21 | 1996–2017 |
| CANON KK | 2 | 2004–2005 |
| IBIDEN CO LTD | 1 | 1991 |
| TOYO JOZO KK | 1 | 1981 |
Locations
| Location | Patents | Span |
|---|---|---|
| Suwa, JP | 9 | 1996–2004 |
| Chino, JP | 6 | 2015–2017 |
| Nagano, JP | 5 | 1998–2016 |
| Urawa, JP | 2 | 2004–2005 |
| Ryuo-cho, JP | 1 | 2005 |