Inventor
Eugene Wang
Inventor
Shanghai, CN
Overview
Patents· 19 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables18%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes15%
G05BControl or regulating systems in general9%
H04LTransmission of digital information, e.g. telegraphic communication9%
G06FElectric digital data processing6%
H02JElectric power networks6%
Y02BClimate change mitigation technologies related to buildings, e.g. housing, house appliances or related end-user applications6%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution6%
Y04SSystems integrating technologies related to power network operation, communication or information technologies for improving the electrical power generation, transmission, distribution, management or usage, i.e. smart grids6%
B42DBooks3%
PatentTitleYear
8,942,955'Operationalizing a power usage monitoring system'20158,044,668'Method and system for calibrating measurement tools for semiconductor device manufacturing'20117,989,228'Method and structure for sample preparation for scanning electron microscopes in integrated circuit manufacturing'20117,988,198'Photo album'20117,840,383'Operationalizing a power usage monitoring system'20107,831,409'Method and system for yield similarity of semiconductor devices'20107,669,197'Embedded system employing component architecture platform'20107,447,610'Method and system for reliability similarity of semiconductor devices'20087,321,836'Method for determining the equivalency index of goods, processes, and services'20087,319,938'Method and system for processing commonality of semiconductor devices'20087,286,958'Method and system for yield similarity of semiconductor devices'20077,076,387'Method for determining the equivalency index of products and processes'20067,024,334'Method and system for yield similarity of semiconductor devices'20067,003,430'Method and system for processing commonality of semiconductor devices'20066,965,844'Method and system for processing stability of semiconductor devices'20056,850,846'Computer software for genotyping analysis using pattern recognition'20056,789,031'Method for determining the equivalency index of products, processes, and services'20046,167,469'Digital camera having display device for displaying graphical representation of user input and method for transporting the selected digital images thereof'20005,289,138'Apparatus for synchronously selecting different oscillators as system clock source'1994Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2000Patents assigned to AGILENT TECHNOLOGIES INC (1)· patent assignee history
2000–2015Based in Palo Alto, CA, US· patent location history
2004–2008Patents assigned to TEXAS INSTRUMENTS INC (3)· patent assignee history
2004–2008Based in Dallas, TX, US· patent location history
2005–2011Patents assigned to SEMICONDUCTOR MFG INT SHANGHAI (8)· patent assignee history
2005Patents assigned to AFFYMETRIX INC (1)· patent assignee history
2005–2011Based in Shanghai, CN· patent location history
2010–2015Patents assigned to WANG EUGENE (3)· patent assignee history
2010Based in Laguna Niguel, CA, US· patent location history
2011Based in Temple City, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SEMICONDUCTOR MFG INT SHANGHAI | 8 | 2005–2011 |
| TEXAS INSTRUMENTS INC | 3 | 2004–2008 |
| WANG EUGENEself | 3 | 2010–2015 |
| AFFYMETRIX INC | 1 | 2005 |
| AGILENT TECHNOLOGIES INC | 1 | 2000 |
Locations
| Location | Patents | Span |
|---|---|---|
| Shanghai, CN | 9 | 2005–2011 |
| Palo Alto, California, US | 3 | 2000–2015 |
| Dallas, Texas, US | 3 | 2004–2008 |
| Temple City, California, US | 1 | 2011 |
| Laguna Niguel, California, US | 1 | 2010 |