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Inventor

Tessema Kebede

Inventor
Peekskill, NY, US

Overview

1→
Patents
1999
Patent span
Physics
Primary field (CPC G)

Patents· 1 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables100%
PatentTitleYear
5,959,459'Defect monitor and method for automated contactless inline wafer inspection'1999

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1999Patents assigned to IBM (1)· patent assignee history
1999Based in Peekskill, NY, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
IBM11999
Locations
LocationPatentsSpan
Peekskill, New York, US11999