Inventor
Tetsuji Onuki
Inventor
Yokohama, JP
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Qprimary
G01QScanning-probe techniques or apparatus25%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests25%
B82YSpecific uses or applications of nanostructures20%
G02BOptical elements, systems or apparatus10%
G01BMeasuring length, thickness or similar linear dimensions5%
G01KMeasuring temperature5%
G01MTesting static or dynamic balance of machines or structures5%
H01JElectric discharge tubes or discharge lamps5%
PatentTitleYear
5,986,760'Shape measurement method and high-precision lens manufacturing process'19995,929,438'Cantilever and measuring apparatus using it'19995,656,769'Scanning probe microscope'19975,508,517'Scanning probe type microscope apparatus'19965,360,977'Compound type microscope'19945,317,153'Scanning probe microscope'1994Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1994–1999Patents assigned to NIKON CORP (6)· patent assignee history
1994–1999Based in Yokohama, JP· patent location history
1996Based in Kanagawa, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NIKON CORP | 6 | 1994–1999 |
Locations
| Location | Patents | Span |
|---|---|---|
| Yokohama, JP | 5 | 1994–1999 |
| Kanagawa, JP | 1 | 1996 |