Inventor
Katsunori Honma
Inventor
Chiba, JP
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Qprimary
G01QScanning-probe techniques or apparatus21%
B82YSpecific uses or applications of nanostructures18%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests18%
G02BOptical elements, systems or apparatus12%
H01QAntennas, i.e. radio aerials6%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein3%
G11BInformation storage based on relative movement between record carrier and transducer3%
H01PWaveguides3%
H04BTransmission3%
H04HBroadcast communication3%
PatentTitleYear
9,136,976'Wireless communication apparatus and wireless communication method'20158,145,122'Power supply adapter and power supply system'20127,484,873'Illumination device having elliptical body and display device using the same'20097,366,392'Lighting device and display device using the same'20087,264,389'Illuminating unit and display device using the unit'20076,469,679'Antenna installation device and satellite radio frequency receiver antenna device'20026,430,324'Optical probe and method for manufacturing same and scanning proximity field optical microscope'20026,426,729'Conductive transmission line waveguide converter, microwave reception converter and satellite broadcast reception antenna'20026,396,050'Self-emitting optical probe, method for producing the same, and scanning near-field optical microscope'20026,280,647'Method for sharpening a probe'20016,239,426'Scanning probe and scanning probe microscope'20016,100,534'Microscopic area scanning apparatus'20005,821,409'Scanning near-field optic/atomic-force microscope with observing function in liquid'19985,258,107'Method for manufacturing a cantilever with sharpened metal needle'1993Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1993–2009Patents assigned to SEIKO INSTR INC (10)· patent assignee history
1993–2015Based in Tokyo, JP· patent location history
1998–2009Based in Chiba, JP· patent location history
2002–2015Patents assigned to SONY CORP (4)· patent assignee history
2002Based in Mihama-ku, JP· patent location history
2012–2015Patents assigned to HONMA KATSUNORI (2)· patent assignee history
2012Patents assigned to FUJITA KOSUKE (1)· patent assignee history
2012Patents assigned to ISHIKAWA RIKIYA (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SEIKO INSTR INC | 10 | 1993–2009 |
| SONY CORP | 4 | 2002–2015 |
| HONMA KATSUNORIself | 2 | 2012–2015 |
| FUJITA KOSUKE | 1 | 2012 |
| ISHIKAWA RIKIYA | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Chiba, JP | 10 | 1998–2009 |
| Tokyo, JP | 3 | 1993–2015 |
| Mihama-ku, JP | 1 | 2002 |