Inventor
Jais Abraham
Inventor
Malapurram, IN
Overview
Patents· 7 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables45%
G11CStatic stores18%
H03KPulse technique18%
G06FElectric digital data processing9%
Y02DClimate change mitigation technologies in information and communication technologies [ict], i.e. information and communication technologies aiming at the reduction of their own energy use9%
PatentTitleYear
10,656,203Low pin count test controller20207,421,634'Sequential scan based techniques to test interface between modules designed to operate at different frequencies'20087,404,126'Scan tests tolerant to indeterminate states when employing signature analysis to analyze test outputs'20087,352,169'Testing components of I/O paths of an integrated circuit'20087,082,558'Increasing possible test patterns which can be used with sequential scanning techniques to perform speed analysis'20066,981,190'Controlling the content of specific desired memory elements when testing integrated circuits using sequential scanning techniques'20056,853,212'Gated scan output flip-flop'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2008Patents assigned to TEXAS INSTRUMENTS INC (6)· patent assignee history
2005–2008Based in Malapurram, IN· patent location history
2005–2008Based in Kerala, IN· patent location history
2008Based in Malapuram, IN· patent location history
2020Patents assigned to QUALCOMM INC (1)· patent assignee history
2020Based in Bangalore, IN· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TEXAS INSTRUMENTS INC | 6 | 2005–2008 |
| QUALCOMM INC | 1 | 2020 |
Locations
| Location | Patents | Span |
|---|---|---|
| Malapurram, IN | 3 | 2005–2008 |
| Kerala, IN | 2 | 2005–2008 |
| Bangalore, IN | 1 | 2020 |
| Malapuram, IN | 1 | 2008 |