Inventor
Yoko Ono
Inventor
Yokohama, JP
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties36%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1027%
B01JChemical or physical processes, e.g. catalysis or colloid chemistry9%
G01RMeasuring electric variables9%
G06VImage or video recognition or understanding9%
H01JElectric discharge tubes or discharge lamps9%
PatentTitleYear
8,700,498'Feature analyzing apparatus for a surface of an object'20148,508,246'Substrate surface inspecting apparatus and substrate surface inspecting method'20138,497,985'Inspection method based on captured image and inspection device'20138,488,867'Inspection device for disk-shaped substrate'20137,109,660'Plasma processing device and baffle plate thereof'2006Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2006Based in Kanagawa, JP· patent location history
2013–2014Patents assigned to HAYASHI YOSHINORI (4)· patent assignee history
2013–2014Patents assigned to MIYAZONO KOICHI (4)· patent assignee history
2013–2014Patents assigned to MORI HIDEKI (4)· patent assignee history
2013–2014Patents assigned to ONO YOKO (4)· patent assignee history
2013–2014Patents assigned to SHIBAURA MECHATRONICS CORP (4)· patent assignee history
2013–2014Based in Yokohama, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HAYASHI YOSHINORI | 4 | 2013–2014 |
| MIYAZONO KOICHI | 4 | 2013–2014 |
| MORI HIDEKI | 4 | 2013–2014 |
| ONO YOKOself | 4 | 2013–2014 |
| SHIBAURA MECHATRONICS CORP | 4 | 2013–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Yokohama, JP | 4 | 2013–2014 |
| Kanagawa, JP | 1 | 2006 |