Inventor
Wei-Pin Changchien
Inventor
Taichung, TW
Overview
Patents· 20 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Fprimary
G06FElectric digital data processing20%
G01RMeasuring electric variables16%
H01LSemiconductor devices16%
H03KPulse technique8%
H10DInorganic electric semiconductor devices8%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h108%
G06NComputing arrangements based on specific computational models4%
G06TImage data processing or generation, in general4%
G11CStatic stores4%
H05KPrinted circuits4%
PatentTitleYear
11,017,149Machine-learning design enablement platform202110,866,281System and method to diagnose integrated circuit202010,678,973Machine-learning design enablement platform202010,267,853System and method to diagnose integrated circuit20199,847,318Monolithic stacked integrated circuits with a redundant layer for repairing defects20179,601,478'Oxide definition (OD) gradient reduced semiconductor device'20179,478,469'Integrated circuit comprising buffer chain'20169,310,431'Diagnosis framework to shorten yield learning cycles of advanced processes'20169,286,431'Oxide definition (OD) gradient reduced semiconductor device and method of making'20169,269,640'Repairing monolithic stacked integrated circuits with a redundant layer and lithography process'20169,097,762'Method and apparatus for diagnosing an integrated circuit'20158,981,842'Integrated circuit comprising buffer chain'20158,937,512'Voltage-controlled oscillator'20158,701,070'Group bounding box region-constrained placement for integrated circuit design'20148,566,766'Method for detecting small delay defects'20138,384,430'RC delay detectors with high sensitivity for through substrate vias'20138,347,132'System and method for reducing processor power consumption'20138,339,155'System and method for detecting soft-fails'20128,258,883'System and method for characterizing process variations'20128,113,412'Methods for detecting defect connections between metal bumps'2012Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2012–2016Patents assigned to TAIWAN SEMICONDUCTOR MFG (12)· patent assignee history
2012–2016Patents assigned to CHANGCHIEN WEI-PIN (8)· patent assignee history
2012–2014Patents assigned to LIU CHIN-CHOU (6)· patent assignee history
2012–2016Patents assigned to TSENG NAN-HSIN (4)· patent assignee history
2012–2021Based in Taichung, TW· patent location history
2016–2021Patents assigned to TAIWAN SEMICONDUCTOR MFG CO LTD (8)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TAIWAN SEMICONDUCTOR MFG | 12 | 2012–2016 |
| CHANGCHIEN WEI-PINself | 8 | 2012–2016 |
| TAIWAN SEMICONDUCTOR MFG CO LTD | 8 | 2016–2021 |
| LIU CHIN-CHOU | 6 | 2012–2014 |
| TSENG NAN-HSIN | 4 | 2012–2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Taichung, TW | 20 | 2012–2021 |